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Volumn 509, Issue 5, 2011, Pages 1947-1952

Optical, structural and surface characterization of ultrasonically sprayed CdO:F films

Author keywords

AFM; CdO:F; Spectroscopic ellipsometry; Thin film; Ultrasonic spray pyrolysis; XRD

Indexed keywords

AFM; ATOMIC FORCE MICROSCOPE IMAGES; BAND-GAP VALUES; CDO FILMS; CDO:F; CRYSTALLINITIES; EXTINCTION COEFFICIENTS; F-DOPING; OPTICAL METHODS; PROMISING MATERIALS; REFLECTANCE SPECTRUM; SOLAR-CELL APPLICATIONS; STRUCTURAL AND SURFACE CHARACTERIZATION; TEXTURE COEFFICIENT; ULTRASONIC SPRAY PYROLYSIS; ULTRASONIC SPRAY PYROLYSIS TECHNIQUE; XRD;

EID: 78651367201     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2010.10.097     Document Type: Article
Times cited : (52)

References (35)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.