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Volumn 509, Issue 5, 2011, Pages 1947-1952
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Optical, structural and surface characterization of ultrasonically sprayed CdO:F films
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Author keywords
AFM; CdO:F; Spectroscopic ellipsometry; Thin film; Ultrasonic spray pyrolysis; XRD
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Indexed keywords
AFM;
ATOMIC FORCE MICROSCOPE IMAGES;
BAND-GAP VALUES;
CDO FILMS;
CDO:F;
CRYSTALLINITIES;
EXTINCTION COEFFICIENTS;
F-DOPING;
OPTICAL METHODS;
PROMISING MATERIALS;
REFLECTANCE SPECTRUM;
SOLAR-CELL APPLICATIONS;
STRUCTURAL AND SURFACE CHARACTERIZATION;
TEXTURE COEFFICIENT;
ULTRASONIC SPRAY PYROLYSIS;
ULTRASONIC SPRAY PYROLYSIS TECHNIQUE;
XRD;
CADMIUM COMPOUNDS;
CRYSTALLITE SIZE;
DIFFRACTION;
DOPING (ADDITIVES);
FLUORINE;
LATTICE CONSTANTS;
REFRACTIVE INDEX;
SPECTROSCOPIC ELLIPSOMETRY;
SURFACE TOPOGRAPHY;
THIN FILMS;
TOPOGRAPHY;
ULTRASONIC TESTING;
ULTRASONICS;
X RAY DIFFRACTION;
SPRAY PYROLYSIS;
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EID: 78651367201
PISSN: 09258388
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jallcom.2010.10.097 Document Type: Article |
Times cited : (52)
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References (35)
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