메뉴 건너뛰기




Volumn 546, Issue , 2012, Pages 280-285

Studies of the hot-pressed TiN material by electron spectroscopies

Author keywords

Bulk composition; Elastic peak electron spectroscopy; Electron inelastic mean free path; Hot pressed sputtering target; Surface composition; Titanium nitride; X ray photoelectron spectroscopy

Indexed keywords

CARBON; DEPTH PROFILING; DISSOCIATION; ELECTRON ENERGY LEVELS; ELECTRON TRANSPORT PROPERTIES; NITROGEN; PHOTOELECTRONS; PHOTONS; TITANIUM DIOXIDE; TITANIUM NITRIDE;

EID: 84870227061     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2012.08.089     Document Type: Article
Times cited : (16)

References (59)
  • 31
    • 0003902695 scopus 로고    scopus 로고
    • Standard Reference Data Program Database 71, US. Department of Commerce, National Institute of Standards and Technology, Gaithersburg, MD
    • C.J. Powell, A. Jablonski, NIST ELECTRON INELASTIC-MEAN-FREE-PATH DATABASE, Version 1.1, Standard Reference Data Program Database 71, US. Department of Commerce, National Institute of Standards and Technology, Gaithersburg, MD, 2000 (< http://www.nist.gov/srd/nist71.htm >).
    • (2000) NIST ELECTRON INELASTIC-MEAN-FREE-PATH DATABASE, Version 1.1
    • Powell, C.J.1    Jablonski, A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.