Electron IMFPs in bulk Cd0.88Mn0.12Te crystals determined by EPES

Surface Science

Volumn 600, Issue 18, 2006, Pages 3744-3748

  Krawczyk, M ^a   Kosinski A ^a   Jablonski, A ^a   Mycielski, A ^b  

^a INSTITUTE OF PHYSICAL CHEMISTRY   (Poland)

^b INSTITUTE OF PHYSICS   (Poland)

Author keywords

Cadmium manganese telluride; Elastic peak electron spectroscopy; Electron inelastic mean free path; Electron solid interactions; II VI Semimagnetic semiconductors; Low index single crystal surfaces; Monte Carlo simulations; Quantitative surface analysis

Indexed keywords

AMORPHIZATION; COMPUTER SIMULATION; CRYSTALS; ELECTRON SPECTROSCOPY; MONTE CARLO METHODS; SPUTTERING; X RAY PHOTOELECTRON SPECTROSCOPY;

CADMIUM MANGANESE TELLURIDE; ELASTIC PEAK ELECTRON SPECTROSCOPY; ELECTRON INELASTIC MEAN FREE PATH; ELECTRON-SOLID INTERACTIONS; II-VI SEMIMAGNETIC SEMICONDUCTORS; LOW INDEX SINGLE CRYSTAL SURFACES; QUANTITATIVE SURFACE ANALYSIS;

CADMIUM COMPOUNDS;

EID: 33749156676     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2006.01.077     Document Type: Article

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