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Volumn 84, Issue 20, 2012, Pages 8771-8776

Thickness determination of subnanometer layers using laser ablation inductively coupled plasma mass spectrometry

Author keywords

[No Author keywords available]

Indexed keywords

AL COATINGS; CRATER SIZES; EXTERNAL CALIBRATION; ION SIGNALS; LASER-ABLATION INDUCTIVELY-COUPLED PLASMA MASS SPECTROMETRY; LAYER THICKNESS; LINEAR CORRELATION; METALLIC LAYERS; REFERENCE MATERIAL; SI WAFER; STANDARD REFERENCE MATERIAL; SUBNANOMETERS; THICKNESS DETERMINATION;

EID: 84869480769     PISSN: 00032700     EISSN: 15206882     Source Type: Journal    
DOI: 10.1021/ac302137x     Document Type: Article
Times cited : (20)

References (41)
  • 41
    • 84870635486 scopus 로고    scopus 로고
    • accessed September 27, 2012
    • Jochum, K. P.; Stoll, B. http://georem.mpch-mainz.gwdg.de/ (accessed September 27, 2012), 2008
    • (2008)
    • Jochum, K.P.1    Stoll, B.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.