Investigation of multi-layered silicate ceramics using laser ablation optical emission spectrometry, laser ablation inductively coupled plasma mass spectrometry, and electron microprobe analysis

Chemical Papers

Volumn 65, Issue 6, 2011, Pages 769-781

  Zaoralkova, Linda ^a   Hrdlicka, Ales ^a   Otruba, Vitezslav ^a   Sulovsky, Petr ^b   Gilon, Nicole ^c   Günther, Detlef ^d   Kanicky, Viktor ^a  

^a Department of Chemistry   (Czech Republic)

^b MASARYK UNIVERSITY   (Czech Republic)

^c UNIVERSITÉ LYON 1   (France)

^d LABORATORY OF INORGANIC CHEMISTRY   (Switzerland)

Author keywords

Depth profile; Electron probe X ray microanalysis; Inductively coupled plasma mass spectrometry; Inductively coupled plasma optical spectrometry; Laser ablation; Layered ceramics; Surface analysis

Indexed keywords

EID: 83555174811     PISSN: 03666352     EISSN: 13369075     Source Type: Journal    
DOI: 10.2478/s11696-011-0085-3     Document Type: Article

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