Structural and elemental analysis of iron and indium doped zinc oxide by spectroscopic imaging in Cs-corrected STEM

Micron

Volumn 43, Issue 1, 2012, Pages 49-56

  Schmid, H ^a,d   Okunishi, E ^b   Oikawa, T ^c   Mader, W ^d  

^a INM LEIBNIZ INSTITUTE FOR NEW MATERIALS   (Germany)

^b JEOL LTD   (Japan)

^c JEOL   (France)

^d UNIVERSITY OF BONN   (Germany)

Author keywords

Cs corrected TEM STEM; ESI; Inversion domain boundaries; SIX; Spectroscopic imaging; ZnO

Indexed keywords

ESI; INVERSION DOMAIN BOUNDARIES; SIX; SPECTROSCOPIC IMAGING; TEM/STEM; ZNO;

CESIUM; DOPING (ADDITIVES); ELECTRON ENERGY LOSS SPECTROSCOPY; IRON ANALYSIS; MONOLAYERS; SPECTROSCOPIC ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY;

ZINC OXIDE;

EID: 84855475999     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.micron.2011.05.011     Document Type: Article

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