A high efficiency annular dark field detector for STEM

Ultramicroscopy

Volumn 62, Issue 1-2, 1996, Pages 79-88

  Kirkland, Earl J ^a   Thomas, Malcolm G ^a  

^a Department of Obstetrics Gynecology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INSTRUMENT TESTING; PHOSPHORS; PHOTOMULTIPLIERS; SCANNING ELECTRON MICROSCOPY; SIGNAL TO NOISE RATIO; TRANSMISSION ELECTRON MICROSCOPY;

HIGH EFFICIENCY ANNULAR DARK FIELD DETECTOR; SCANNING TRANSMISSION ELECTRON MICROSCOPE; SOLID QUARTZ LIGHT PIPE;

DETECTORS;

ARTICLE; IMAGE ENHANCEMENT; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0029944284     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/0304-3991(95)00092-5     Document Type: Article

References (36)

1. J. Wall, J. Langmore, M. Isaacson and A. Crewe. Proc. Natl. Acad. Sci. USA 71, No. 1 (1974) 1.
2. M.S. Isaacson, J. Langmore, N.W. Parker, D. Kopf and M. Utlaut, Ultramicroscopy 1 (1976) 359.
3. S.J. Pennycook and D.E. Jesson, Ultramicroscopy 37 (1991) 14.
4. E.J. Kirkland, R.F. Loane and J. Silcox, Ultramicroscopy 23 (1987) 77.
5. R.F. Loane, E.J. Kirkland and J. Silcox, Acta Cryst. A 44 (1988) 912.
6. E.J. Kirkland, R.F. Loane, P. Xu and J. Silcox, in: Computer Simulation of Electron and Microscope Diffraction and Images, Eds. W. Krakow and M. O'Keefe (The Minerals, Metals and Materials Society, Warrendale, 1989) p. 13.
7. I.R.M. Wardell, Ultramicroscopy 7 (1981) 39.
8. N.H. Dekkers and H. deLang, Philips Tech. Rev. 37 (1977) 1.
9. H. Rose, Ultramicroscopy 2 (1977) 251.
10. A. Ishikawa, C. Morita, M. Hibino and S. Maruse, in: Proc. 9th Int. Congr. on Electron Microscopy, Toronto, 1978, Vol. 1, p. 84.
11. J.F.L. Ward, M.T. Browne and R.E. Burge, in: EMAG 79, Inst. Phys. Conf. Ser. 52 (1980) 85.
12. M.T. Browne and J.F.L. Ward, Ultramicroscopy 7 (1982) 249.
13. R.E. Burge, M.T. Browne, P. Charalambous, A. Clark and J.K. Wu, J. Microscopy 127 (1982) 47.
14. M. Mankos, S.-Y. Wang, J.K. Weiss and J.M. Cowley, in: Proc. 50th Annual EMSA Meeting (San Francisco Press, San Francisco, 1992) p. 102.
15. S.-Y. Wang, M. Mankos and J.M. Cowley, in: Proc. 50th Annual EMSA Meeting (San Francisco Press, San Francisco, 1992) p. 982.
16. C.W. Oatley, J. Phys. E (Sci. Instr.) 14 (1981) 971.
17. James Pawley, Scanning Electron Microscopy/1974, p. 28.
18. R. Autrata, P. Schauer, Josef Kvapil and Jiri Kvapil, Scanning Electron Microscopy/1983, Vol. II, p. 489.
19. R. Autrata, P. Schauer, Jiri Kvapil and Josef Kvapil, Scanning 5 (1983) 92.
20. W.R. Leo, Techniques for Nuclear and Particle Physics Experiments (Springer, Berlin, 1987).
21. G.F. Knoll, Radiation Detection and Measurement, 2nd ed. (Wiley, New York, 1989).
22. A.I. Kilvington, C.A. Baker and P. Illinesi, Nucl. Instr. Methods 80 (1970) 177.
23. R. Autrata, R. Herrmann and M. Muller, Scanning 14 (1992) 127.
24. P. Schauer and R. Autrata, Scanning 14 (1992) 325.
25. P. Schauer and R. Autrata, J. Microsc. Spectrosc. Electron. 4 (1979) 633.
26. P. Xu, PhD Thesis, Cornell University, 1991, Appendix B.
27. E. Hecht, Optics, 2nd ed. (Addison-Wesley, Reading, MA. 1987) Fig. 4.29.
28. M. Isaacson and M. Scheinfein, J. Vac. Sci. Technol. B 1 (1983) 1338.
29. M. Hibino, K. Irie, R. Autrata and P. Schauer, in: Proc. 12th Int. Congr. on Electron Microscopy (San Francisco Press, San Francisco, 1990) p. 166.
30. I. Daberkow, K.-H. Herrmann, L. Liu and W.D. Rau, Ultramicroscopy 38 (1991) 215.
31. E.J. Kirkland, Ultramicroscopy 32 (1990) 349.
32. R. Egerton, C.E. Fiori, J.A. Hunt, M.S. Isaacson, E.J. Kirkland and N. Zaluzec, EMSA Bull. 21, No. 2 (November 1991) 35; MSA Bull. 23, No. 4 (October 1993) xxxi.
33. R. Egerton, C.E. Fiori, J.A. Hunt, M.S. Isaacson, E.J. Kirkland and N. Zaluzec, EMSA Bull. 21, No. 2 (November 1991) 35; MSA Bull. 23, No. 4 (October 1993) xxxi.
34. P. Xu, E.J. Kirkland and J. Silcox, Ultramicroscopy 32 (1990) 93.
35. L.W. Swanson and L.C. Crouser, J. Appl. Phys. 40 (1969) 4741.
36. C.H. Kleint, Surf. Sci. 25 (1971) 394 and 411.