Structure- and composition-dependent electron field emission from nitrogenated carbon nanotips

Journal of Applied Physics

Volumn 112, Issue 8, 2012, Pages

  Wang, B B ^a,b   Ostrikov, K ^b,c   Gong, C S ^d   Xie, E Q ^d   Wang, R Z ^e  

^a CHONGQING UNIVERSITY OF TECHNOLOGY   (China)

^b CSIRO   (Australia)

^c UNIVERSITY OF SYDNEY   (Australia)

^d LANZHOU UNIVERSITY   (China)

^e BEIJING UNIVERSITY OF TECHNOLOGY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ADVANCED APPLICATIONS; ANALYTICAL CHARACTERIZATION; CARBON AND NITROGEN; CARBON NANOMATERIALS; CARBON NANOTIPS; ELECTRON EMISSION PROPERTIES; ELECTRON FIELD EMISSION; FIELD EMISSION SCANNING ELECTRON MICROSCOPY; FIELD ENHANCEMENT FACTOR; FOWLER-NORDHEIM; HIGH-VACUUM CONDITIONS; HOT-FILAMENT CHEMICAL VAPOR DEPOSITION; MICRO RAMAN SPECTROSCOPY; MODELING RESULTS; RADIUS OF CURVATURE; REDUCTION OF OXYGEN; SURFACE AREA;

CHEMICAL VAPOR DEPOSITION; FIELD EMISSION; FIELD EMISSION MICROSCOPES; NANOTIPS; PHOTOELECTRONS; RAMAN SPECTROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

CARBON;

EID: 84868373354     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4759047     Document Type: Article

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