Some comments on models for field enhancement

Ultramicroscopy

Volumn 95, Issue SUPPL., 2003, Pages 57-65

  Forbes, Richard G ^a   Edgcombe, C J ^b,c   Valdre U ^d  

^a UNIVERSITY OF SURREY   (United Kingdom)

^b UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^c Granta Electronics   (United Kingdom)

^d INFM   (Italy)

Author keywords

Field emission; Field enhancement factors; Models for nanoprotrusions; Numerical modelling

Indexed keywords

COMPUTER SIMULATION; MATHEMATICAL MODELS; NUMERICAL ANALYSIS; PLANERS; SPHERES;

FIELD ENHANCEMENT FACTORS;

MICROSCOPIC EXAMINATION;

ARTICLE; FIELD EMISSION; MATHEMATICAL MODEL; PHYSICAL MODEL; SIMULATION; SURFACE PROPERTY;

EID: 0037402121     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(02)00297-8     Document Type: Article

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