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Journal of Applied Physics

Volumn 109, Issue 8, 2011, Pages

Exact equipotential profile mapping: A self-validating method

(3) Filip, L D a,b David Carey, J a Silva, S R P a

a UNIVERSITY OF SURREY (United Kingdom)

b NATIONAL INSTITUTE OF MATERIALS PHYSICS (Romania)

Author keywords

[No Author keywords available]

Indexed keywords

DISCRETE SETS; ELECTRIC FIELD ENHANCEMENT FACTOR; ELECTROSTATIC POTENTIALS; GENERAL METHOD; HIGH ASPECT RATIO STRUCTURES; OPTIMUM NUMBER; SPINDT TIP; SYMMETRY AXIS;

ASPECT RATIO; CYLINDERS (SHAPES); ELECTRIC FIELDS;

CARBON NANOTUBES;

EID: 79955726577 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3582141 Document Type: Article

Times cited : (15)

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