Water assisted gate induced temporal surface charge distribution probed by electrostatic force microscopy

Journal of Applied Physics

Volumn 112, Issue 8, 2012, Pages

  Pascal Levy, Y ^a   Shifman, E ^a   Sivan, I ^a   Kalifa, I ^a   Pal Chowdhury, M ^a   Shtempluck, O ^a   Razin, A ^a   Kochetkov, V ^a   Yaish, Y E ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE REDISTRIBUTION; DIELECTRIC LAYER; DOMINANT FACTOR; ELECTROSTATIC FORCE MICROSCOPY; FORCE CURVE; GROUNDED ELECTRODES; HYSTERESIS PHENOMENON; NANOSCALE DEVICE; QUANTITATIVE METHOD; TRANSFER CHARACTERISTICS;

CHARGE DISTRIBUTION; ELECTRIC FORCE MICROSCOPY;

ELECTROSTATIC FORCE;

EID: 84868356914     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4761981     Document Type: Article

References (28)

1. M. Nonnenmacher, M. P. OBoyle, and H. K. Wickramasinghe, Kelvin probe force microscopy., Appl. Phys. Lett. 58, 2921-2923 (1991). 10.1063/1.105227
2. J. Lambert, C. Guthmann, and M. Saint-Jean, Relationship between charge distribution and its image by electrostatic force microscopy., J. Appl. Phys. 93, 5369-5376 (2003). 10.1063/1.1559411
3. K. Domansky, Y. Leng, C. C. Williams, J. Janata, and D. Petelenz, Mapping of mobile charges on insulator surfaces with the electrostatic force microscope., Appl. Phys. Lett. 63, 1513-1515 (1993). 10.1063/1.110759
4. M. Paillet, P. Poncharal, and A. Zahab, Electrostatics of Individual single-walled carbon nanotubes investigated by electrostatic force microscopy., Phys. Rev. Lett. 94, 186801 (2005). 10.1103/PhysRevLett.94.186801
5. C. Staii, A. T. Johnson, and N. J. Pinto, Quantitative analysis of scanning conductance microscopy., Nano Lett. 4, 859-862 (2004). 10.1021/nl049748w
6. A. Bachtold, M. S. Fuhrer, S. Plyasunov, M. Forero, E. H. Anderson, A. Zettl, and P. L. McEuen, Scanned probe microscopy of electronic transport in carbon nanotubes., Phys. Rev. Lett. 84, 6082-6085 (2000). 10.1103/PhysRevLett. 84.6082
7. M. Bockrath, N. Markovic, A. Shepard, M. Tinkham, L. Gurevich, L. P. Kouwenhoven, M. W. Wu, and L. L. Sohn, Scanned conductance microscopy of carbon nanotubes and lambda-DNA., Nano Lett. 2, 187-190 (2002). 10.1021/nl0100724
8. J. Kim, W. Jasper, R. Barker, and J. Hinestroza, Application of electrostatic force microscopy on characterizing an electrically charged fiber., Fibers Polym. 11, 775-781 (2010). 10.1007/s12221-010-0775-4
9. T. Melin, D. Deresmes, and D. Stievenard, Charge injection in individual silicon nanoparticles deposited on a conductive substrate., Appl. Phys. Lett. 81, 5054-5056 (2002). 10.1063/1.1532110
10. C. Y. Ng, T. P. Chen, H. W. Lau, Y. Liu, M. S. Tse, O. K. Tan, and V. S. W. Lim, Visualizing charge transport in silicon nanocrystals embedded in SiO2 films with electrostatic force microscopy., Appl. Phys. Lett. 85, 2941-2943 (2004). 10.1063/1.1801675
11. D. M. Schaadt, E. T. Yu, S. Sankar, and A. E. Berkowitz, Charge storage in Co nanoclusters embedded in SiO2 by scanning force microscopy., Appl. Phys. Lett. 74, 472-474 (1999). 10.1063/1.123039
12. H. Diesinger, T. Melin, S. Barbet, D. Deresmes, and D. Stievenard, Electric force microscopy of individually charged semiconductor nanoparticles., Phys. Status Solidi A 203, 1344-1347 (2006). 10.1002/pssa.200566162
13. G. H. Buh, H. J. Chung, and Y. Kuk, Real-time evolution of trapped charge in a SiO2 layer: An electrostatic force microscopy study., Appl. Phys. Lett. 79, 2010-2012 (2001). 10.1063/1.1404404
14. J. Lambert, G. de Loubens, C. Guthmann, M. Saint-Jean, and T. Melin, Dispersive charge transport along the surface of an insulating layer observed by electrostatic force microscopy., Phys. Rev. B 71, 155418 (2005). 10.1103/PhysRevB.71.155418
15. J. Lambert, C. Guthmann, C. Ortega, and M. Saint-Jean, Permanent polarization and charge injection in thin anodic alumina layers studied by electrostatic force microscopy., J. Appl. Phys. 91, 9161-9169 (2002). 10.1063/1.1466529
16. C. Guillemot, P. Budau, J. Chevrier, F. Marchi, F. Comin, C. Alandi, F. Bertin, N. Buffet, C. Wyon, and P. Mur, Imaging of stored charges in Si quantum dots by tapping and electrostatic force microscopy., Europhys. Lett. 59, 566-571 (2002). 10.1209/epl/i2002-00143-x
17. M. J. Gordon and T. Baron, Amplitude-mode electrostatic force microscopy in UHV: Quantification of nanocrystal charge storage., Phys. Rev. B 72, 165420 (2005). 10.1103/PhysRevB.72.165420
18. M. Zdrojek, T. Melin, H. Diesinger, D. Stievenard, W. Gebicki, and L. Adamowicz, Charging and discharging processes of carbon nanotubes probed by electrostatic force microscopy., J. Appl. Phys. 100, 114326 (2006). 10.1063/1.2392674
19. M. Zdrojek, T. Melin, C. Boyaval, D. Stievenard, B. Jouault, M. Wozniak, A. Huczko, W. Gebicki, and L. Adamowicz, Charging and emission effects of multiwalled carbon nanotubes probed by electric force microscopy., Appl. Phys. Lett. 86, 213114 (2005). 10.1063/1.1925782
20. T. S. Jespersen and J. Nygard, Charge trapping in carbon nanotube loops demonstrated by electrostatic force microscopy., Nano Lett. 5, 1838-1841 (2005). 10.1021/nl0505997
21. S. Hudlet, M. Saint Jean, C. Guthmann, and J. Berger, Evaluation of the capacitive force between an atomic force microscopy tip and a metallic surface., Eur. Phys. J. B 2, 5-10 (1998). 10.1007/s100510050219
22. F. Marchi, R. Dianoux, H. Smilde, P. Mur, F. Comin, and J. Chevrier, Characterisation of trapped electric charge carriers behaviour at nanometer scale by electrostatic force microscopy., J. Electrost. 66, 538-547 (2008). 10.1016/j.elstat.2008.06.006
23. G. Qi, Y. Yang, H. Yan, L. Guan, Y. Li, X. Qiu, and C. Wang, Quantifying surface charge density by using an electric force microscope with a referential structure., J. Phys. Chem. C 113, 204-207 (2009). 10.1021/jp806667h
24. J. Kim, W. J. Jasper, and J. P. Hinestroza, Charge characterization of an electrically charged fiber via electrostatic force microscopy., J. Eng. Fiber Fabr. 1, 30-46 (2006).
25. G. C. Qi, H. Yan, L. Guan, Y. L. Yang, X. H. Qiu, C. Wang, Y. B. Li, and Y. P. Jiang, Characteristic capacitance in an electric force microscope determined by using sample surface bias effect., J. Appl. Phys. 103, 114311 (2008). 10.1063/1.2938846
26. W. Kim, A. Javey, O. Vermesh, Q. Wang, Y. Li, and H. Dai, Hysteresis caused by water molecules in carbon nanotube field-effect transistors., Nano Lett. 3, 193-198 (2003). 10.1021/nl0259232
27. P. S. Na, H. Kim, H.-M. So, K.-J. Kong, H. Chang, B. H. Ryu, Y. Choi, J.-O. Lee, B.-K. Kim, J.-J. Kim, Investigation of the humidity effect on the electrical properties of single-walled carbon nanotube transistors., Appl. Phys. Lett. 87, 093101 (2005). 10.1063/1.2032594
28. M. Rinkio, M. Y. Zavodchikova, P. Torma, and A. Johansson, Effect of humidity on the hysteresis of single walled carbon nanotube field-effect transistors., Phys. Status Solidi B 245, 2315-2318 (2008). 10.1002/pssb. 200879596