Electric force microscopy of individually charged semiconductor nanoparticles

Physica Status Solidi (A) Applications and Materials Science

Volumn 203, Issue 6, 2006, Pages 1344-1347

  Diesinger, H ^a   Melin T ^a   Barbet, S ^a   Deresmes, D ^a   Stievenard D ^a  

^a INSTITUT D ELECTRONIQUE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE INJECTION; ELECTRIC FORCE MICROSCOPY; SEMICONDUCTOR NANOPARTICLES;

ELECTRIC CHARGE; ELECTRIC FIELDS; GALLIUM NITRIDE; NANOSTRUCTURED MATERIALS; NITROGEN; SEMICONDUCTOR QUANTUM DOTS; VACUUM;

SEMICONDUCTOR MATERIALS;

EID: 33646789851     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.200566162     Document Type: Conference Paper

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