Permanent polarization and charge injection in thin anodic alumina layers studied by electrostatic force microscopy

Journal of Applied Physics

Volumn 91, Issue 11, 2002, Pages 9161-9169

  Lambert, J ^a   Guthmann, C ^a   Ortega, C ^a   Saint Jean, M ^a  

^a Groupe de Physique des Solides   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA LAYERS; ANODIC ALUMINA; ANODIC LAYERS; ELECTROSTATIC FORCE MICROSCOPES; ELECTROSTATIC FORCE MICROSCOPY; KELVIN PROBE; METAL/OXIDE INTERFACE; NEGATIVE CHARGE; POLARIZED LAYERS; POSITIVE CHARGES;

ALUMINA; ALUMINUM SHEET; ELECTROSTATIC FORCE; POLARIZATION;

ELECTRIC FORCE MICROSCOPY;

EID: 0036607446     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1466529     Document Type: Article

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