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Volumn 22, Issue 45, 2012, Pages 24012-24016
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Reduced charge fluctuations in individual SnO 2 nanowires by suppressed surface reactions
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Author keywords
[No Author keywords available]
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Indexed keywords
CARRIER NUMBER FLUCTUATION;
CHARGE FLUCTUATIONS;
ELECTRICAL CHARACTERISTIC;
ELECTRICAL NOISE;
ELECTRON TRAPPING;
ENVIRONMENTAL CHANGE;
HIGHER NOISE LEVELS;
METAL OXIDE NANOWIRES;
MOLECULAR SPECIES;
PASSIVATION EFFECT;
PASSIVATION PROCESS;
PMMA COATINGS;
SURFACE PASSIVATION;
DYNAMIC RESPONSE;
FIELD EFFECT TRANSISTORS;
METALLIC COMPOUNDS;
NANOWIRES;
PASSIVATION;
POLYMETHYL METHACRYLATES;
SURFACE REACTIONS;
ELECTRIC PROPERTIES;
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EID: 84868087375
PISSN: 09599428
EISSN: 13645501
Source Type: Journal
DOI: 10.1039/c2jm35361j Document Type: Article |
Times cited : (22)
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References (34)
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