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Volumn 22, Issue 45, 2012, Pages 24012-24016

Reduced charge fluctuations in individual SnO 2 nanowires by suppressed surface reactions

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER NUMBER FLUCTUATION; CHARGE FLUCTUATIONS; ELECTRICAL CHARACTERISTIC; ELECTRICAL NOISE; ELECTRON TRAPPING; ENVIRONMENTAL CHANGE; HIGHER NOISE LEVELS; METAL OXIDE NANOWIRES; MOLECULAR SPECIES; PASSIVATION EFFECT; PASSIVATION PROCESS; PMMA COATINGS; SURFACE PASSIVATION;

EID: 84868087375     PISSN: 09599428     EISSN: 13645501     Source Type: Journal    
DOI: 10.1039/c2jm35361j     Document Type: Article
Times cited : (22)

References (34)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.