Gate capacitance of back-gated nanowire field-effect transistors

Applied Physics Letters

Volumn 89, Issue 8, 2006, Pages

  Wunnicke, Olaf ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CARRIER MOBILITY; ELECTRIC FIELDS; FINITE ELEMENT METHOD; GATES (TRANSISTOR);

ELECTRIC FIELD AMPLIFICATION; INFINITE METAL PLATE; METALLIC CYLINDER; NANOWIRES;

FIELD EFFECT TRANSISTORS;

EID: 33747839682     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2337853     Document Type: Article

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