|
Volumn 21, Issue 48, 2010, Pages
|
Degradation pattern of SnO2 nanowire field effect transistors
|
Author keywords
[No Author keywords available]
|
Indexed keywords
DEGRADATION PATTERNS;
DEVICE PERFORMANCE;
MOBILITY PERFORMANCE;
POSITIVE SHIFT;
POST TREATMENT;
SINGLE NANOWIRES;
DEGRADATION;
MESFET DEVICES;
NANOWIRES;
PASSIVATION;
FIELD EFFECT TRANSISTORS;
|
EID: 78650141011
PISSN: 09574484
EISSN: 13616528
Source Type: Journal
DOI: 10.1088/0957-4484/21/48/485201 Document Type: Article |
Times cited : (9)
|
References (25)
|