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Volumn 21, Issue 48, 2010, Pages

Degradation pattern of SnO2 nanowire field effect transistors

Author keywords

[No Author keywords available]

Indexed keywords

DEGRADATION PATTERNS; DEVICE PERFORMANCE; MOBILITY PERFORMANCE; POSITIVE SHIFT; POST TREATMENT; SINGLE NANOWIRES;

EID: 78650141011     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/21/48/485201     Document Type: Article
Times cited : (9)

References (25)
  • 6
    • 61649123298 scopus 로고    scopus 로고
    • Cheng Y et al 2008 Nano Lett. 8 4179-84
    • (2008) Nano Lett. , vol.8 , pp. 4179-4184
    • Cheng, Y.1
  • 25


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.