Probe-based electro-oxidative lithography of ots sams deposited onto transparent ITO substrates

Advanced Functional Materials

Volumn 22, Issue 20, 2012, Pages 4376-4382

  Meroni, Daniela ^a,b,c   Ardizzone, Silvia ^a   Schubert, Ulrich S ^b,c   Hoeppener, Stephanie ^b,c  

^a UNIVERSITY OF MILAN   (Italy)

^b FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

^c Abbe School of Photonics   (Germany)

Author keywords

electro oxidative nanolithography; indium tin oxide (ITO); n octadecyltrichlorosilane (OTS); scanning Kelvin probe microscopy; self assembled monolayers

Indexed keywords

COMPARATIVE STUDIES; DIAMOND SUBSTRATES; INDIUM TIN OXIDE; INDIUM TIN OXIDE SUBSTRATES; LOCAL OXIDATION; N-OCTADECYLTRICHLOROSILANE; NANO-METER SCALE; OVEROXIDATIONS; OXIDATION PROCESS; PROBE-BASED; SAMS; SCANNING KELVIN PROBE MICROSCOPY; SCANNING PROBES; SI WAFER; SILVER NANOPARTICLES; SITE SELECTIVE; TRANSPARENT CONDUCTIVE OXIDES; TRANSPARENT OXIDES;

DEPOSITS; EXCITONS; INDIUM COMPOUNDS; LITHOGRAPHY; NANOPARTICLES; OXIDATION; OXIDATION RESISTANCE; SELF ASSEMBLED MONOLAYERS; SILICON; SILICON WAFERS; SILVER; SURFACE PROPERTIES; TIN; TIN OXIDES;

SUBSTRATES;

EID: 84867524238     PISSN: 1616301X     EISSN: 16163028     Source Type: Journal    
DOI: 10.1002/adfm.201200673     Document Type: Article

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