Contact angle analysis during the electro-oxidation of self-assembled monolayers formed by n -octadecyltrichlorosilane

Advanced Functional Materials

Volumn 20, Issue 19, 2010, Pages 3252-3259

  Herzer, Nicole ^a,c   Van Schaik, Jurriaan H K ^a,c   Hoeppener, Stephanie ^a,b   Schubert, Ulrich S ^a,b,c  

^a FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

^b DUTCH POLYMER INSTITUTE DPI   (Netherlands)

^c EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

AFM TIP; CHEMICAL NATURE; CONTACT ANGLE ANALYSIS; COUNTER ELECTRODES; ELECTRO-OXIDATION PROCESS; GOOD CORRELATIONS; IN-SITU; IN-SITU MONITORING; N-OCTADECYLTRICHLOROSILANE; OXIDATION PROCESS; WATER CONTACT ANGLE MEASUREMENT; WATER DROPLETS; WATER MENISCUS; WETTING PROPERTY;

ANGLE MEASUREMENT; ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; CONTACT ANGLE; DROP FORMATION; ELECTROCHEMICAL OXIDATION; ELECTRON ENERGY LEVELS; OXIDATION RESISTANCE; SEMICONDUCTING SILICON COMPOUNDS; SILICON WAFERS; X RAY PHOTOELECTRON SPECTROSCOPY;

SELF ASSEMBLED MONOLAYERS;

EID: 77957555559     PISSN: 1616301X     EISSN: 16163028     Source Type: Journal    
DOI: 10.1002/adfm.201000077     Document Type: Article

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