RePRAM: Re-cycling PRAM faulty blocks for extended lifetime

Proceedings of the International Conference on Dependable Systems and Networks

Volumn , Issue , 2012, Pages

  Chen, Jie ^a   Venkataramani, Guru ^a   Huang, H Howie ^a  

^a George Washington University   (United States)

Author keywords

Lifetime; Main memory; Performance; Phase Change Memory; Redundancy

Indexed keywords

AREA OVERHEAD; BENCHMARK SUITES; DRAM TECHNOLOGY; ERROR CORRECTION CAPABILITY; EXTENDED LIFETIME; GROUP SIZE; HARDWARE AND SOFTWARE; HARDWARE COST; HARDWARE MODIFICATIONS; LIFETIME; LOW ENERGY CONSUMPTION; MAIN MEMORY; MEMORY TECHNOLOGY; NONVOLATILITY; OFF-CHIP; ON CHIPS; PERFORMANCE; PERFORMANCE IMPACT; PHASE CHANGES; PROCESS VARIATION; STORAGE DENSITIES;

ENERGY UTILIZATION; ERROR CORRECTION; HARDWARE; PHASE CHANGE MEMORY; REDUNDANCY;

DYNAMIC RANDOM ACCESS STORAGE;

EID: 84866677903     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DSN.2012.6263950     Document Type: Conference Paper

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