On the electro-mechanical reliability of NEMFET as an analog/digital switch

IEEE International Reliability Physics Symposium Proceedings

Volumn , Issue , 2012, Pages

  Jain, Ankit ^a   Islam, A E ^b   Alam, M A ^b  

^a PURDUE UNIVERSITY   (United States)

^b University of Illinois at Urbana Champaign   (United States)

Author keywords

Creep; Electro Mechanical; HCI; NBTI; NEMFET; Reliability; Switch

Indexed keywords

CATASTROPHIC FAILURES; CLASSICAL THEORY; DIGITAL SWITCH; ELECTRO-MECHANICAL; EULER-BERNOULLI; HOT CARRIER INJECTION; INDUCED DEGRADATION; MECHANICAL CREEP; METAL OXIDE SEMICONDUCTOR FIELD-EFFECT TRANSISTORS; MOS-FET; NBTI; NEGATIVE BIAS TEMPERATURE INSTABILITY; NEMFET; OFF-STATE CAPACITANCE; PARAMETRIC DEGRADATION; PULL-IN; PULL-IN/PULL-OUT VOLTAGE; RELEASE DYNAMICS; STATIC AND DYNAMIC BEHAVIORS; TIME DEPENDENT; TIME EVOLUTIONS;

CREEP; HUMAN COMPUTER INTERACTION; INTEGRATED CIRCUITS; RELIABILITY; SWITCHES;

MOSFET DEVICES;

EID: 84866627842     PISSN: 15417026     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IRPS.2012.6241915     Document Type: Conference Paper

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