Exploring atomic-scale lateral forces in the attractive regime: A case study on graphite (0001)

Nanotechnology

Volumn 23, Issue 40, 2012, Pages

  Baykara, Mehmet Z ^a,b   Schwendemann, Todd C ^a,c   Albers, Boris J ^a   Pilet, Nicolas ^a   Mönig, Harry ^a   Altman, Eric I ^a   Schwarz, Udo D ^a  

^a Yale University   (United States)

^b BILKENT UNIVERSITY   (Turkey)

^c SOUTHERN CONNECTICUT STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE; ATOMIC SCALE; CONTACT AREAS; DIRECTIONAL ANALYSIS; FRICTIONAL RESISTANCE; GRAPHITE SURFACES; LATERAL FORCE; LOW TEMPERATURES; MEASUREMENT PRINCIPLE; NON-CONTACT; NORMAL FORCES; PICOMETER RESOLUTION; PROBE TIPS; TIME-PERIODS; TIP APEX; TIP-SAMPLE DISTANCE;

ATOMIC FORCE MICROSCOPY; SLIP FORMING;

GRAPHITE;

EID: 84866546735     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/23/40/405703     Document Type: Article

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