Modulation of contact resonance frequency accompanying atomic-scale stick-slip in friction force microscopy

Nanotechnology

Volumn 20, Issue 49, 2009, Pages

  Steiner, Pascal ^a   Roth, Raphael ^a   Gnecco, Enrico ^a   Glatzel, Thilo ^a   Baratoff, Alexis ^a   Meyer, Ernst ^a  

^a UNIVERSITY OF BASEL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC-SCALE DEFECTS; ATOMIC-SCALE FRICTION; ATOMIC-SCALE STICK-SLIP; CONTACT FREQUENCY; CONTACT RESONANCE; DYNAMIC MEASUREMENT; FRICTION FORCE MICROSCOPY; LATERAL CONTACT; LATERAL FORCE; QUASI-STATIC; SMALL OSCILLATIONS; TORSIONAL RESONANCES;

FORCE MEASUREMENT; FRICTION; NATURAL FREQUENCIES; SLIP FORMING; SODIUM CHLORIDE;

ATOMS;

AMPLITUDE MODULATION; ARTICLE; ATOMIC FORCE MICROSCOPY; ATOMIC SCALE FRICTION; CONTACT RESONANCE ATOMIC FORCE MICROSCOPY; FREQUENCY MODULATION; FRICTION; FRICTION FORCE MICROSCOPY; MEASUREMENT; MECHANICAL TORSION; MICROSCOPY; MOLECULAR DYNAMICS; OSCILLATION; PHASE TRANSITION; PRIORITY JOURNAL; RIGIDITY; SENSITIVITY ANALYSIS;

EID: 70449933890     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/20/49/495701     Document Type: Article

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