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Volumn 2, Issue 3, 2012, Pages

Bias-induced migration of ionized donors in amorphous oxide semiconductor thin-film transistors with full bottom-gate and partial top-gate structures

(3) Mativenga, Mallory a Hwang, Tae Ha a Janga, Jin a

a Kyung Hee University (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

IONIZATION; OXIDE SEMICONDUCTORS; THIN FILM CIRCUITS; THIN FILMS;

AMORPHOUS OXIDE SEMICONDUCTOR (AOS); BOTTOM GATE; INDUCED CHARGES; IONIZED DONORS; TOP GATE;

THIN FILM TRANSISTORS;

EID: 84866341849 PISSN: None EISSN: 21583226 Source Type: Journal
DOI: 10.1063/1.4742853 Document Type: Article

Times cited : (12)

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