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Applied Physics Letters

Volumn 101, Issue 6, 2012, Pages

Scanning gate microscopy on a graphene nanoribbon

(4) Pascher, Nikola a Bischoff, Dominik a Ihn, Thomas a Ensslin, Klaus a

a ETH ZURICH (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE LOCALIZATION; GRAPHENE NANO-RIBBON; HIGH RESOLUTION; METALLIC TIPS; REAL-SPACE; SCANNING GATE MICROSCOPY; SCANNING PROBE MICROSCOPE;

PHYSICAL PROPERTIES;

PHYSICS;

EID: 84865130990 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.4742862 Document Type: Article

Times cited : (42)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.