The relevance of electrostatics for scanning-gate microscopy

New Journal of Physics

Volumn 13, Issue , 2011, Pages

  Schnez, S ^a   Guttinger J ^a   Stampfer, C ^a,b   Ensslin, K ^a   Ihn, T ^a  

^a ETH ZURICH   (Switzerland)

^b RWTH AACHEN UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON NANO-TUBE STRUCTURES; GATE VOLTAGES; LOCAL INFORMATION; METALLIC TIPS; PHYSICAL PROCESS; PHYSICAL SYSTEMS; QUANTUM DOTS;

CARBON NANOTUBES; GRAPHENE; NANOSTRUCTURES;

SCANNING;

EID: 79956333408     PISSN: 13672630     EISSN: None     Source Type: Journal    
DOI: 10.1088/1367-2630/13/5/053013     Document Type: Article

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