Measurement of the tip-induced potential in scanning gate experiments

Physical Review B - Condensed Matter and Materials Physics

Volumn 75, Issue 19, 2007, Pages

  Gildemeister, A E ^a   Ihn, T ^a   Sigrist, M ^a   Ensslin, K ^a   Driscoll, D C ^b   Gossard, A C ^b  

^a ETH ZURICH   (Switzerland)

^b University of California   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 34347337655     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.75.195338     Document Type: Article

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