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Physica E: Low-Dimensional Systems and Nanostructures

Volumn 12, Issue 1-4, 2002, Pages 691-694

Scanning gate measurements on a quantum wire

(7) Ihn, T a Rychen, J a Cilento, T a Held, R a Ensslin, K a Wegscheider, W b Bichler, M c

a ETH ZURICH (Switzerland)

b UNIVERSITY OF REGENSBURG (Germany)

c WALTER SCHOTTKY INSTITUT (Germany)

Author keywords

Phase coherence effects; Quantum wires; Scanning probe techniques

Indexed keywords

ELECTRIC RESISTANCE MEASUREMENT; ELECTRON TRANSPORT PROPERTIES; FERMI LEVEL; GATES (TRANSISTOR); OSCILLATIONS; TRANSCONDUCTANCE; VOLTAGE MEASUREMENT; WAVE INTERFERENCE;

PHASE COHERENCE EFFECTS; SCANNING FORCE MICROSCOPES;

SEMICONDUCTOR QUANTUM WIRES;

EID: 0035239589 PISSN: 13869477 EISSN: None Source Type: Journal
DOI: 10.1016/S1386-9477(01)00379-4 Document Type: Conference Paper

Times cited : (15)

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