HRTEM techniques applied to nanocrystal modeling: Towards an "atom-by-atom" description

WIT Transactions on Engineering Sciences

Volumn 72, Issue , 2011, Pages 41-54

  Stroppa, D G ^a,b   Montoro, L A ^a   Leite, E R ^c   Ramirez, A J ^a,b  

^a LABORATÓRIO NACIONAL DE LUZ SÍNCROTRON   (Brazil)

^b UNIVERSITY OF CAMPINAS   (Brazil)

^c FEDERAL UNIVERSITY OF SÃO CARLOS   (Brazil)

Author keywords

HRTEM; Nanocrystals modeling; Quantitative analysis

Indexed keywords

3D MORPHOLOGY; AB INITIO; ATOMIC LEVELS; ATOMIC RESOLUTION; ATOMIC-SCALE RESOLUTION; CHARACTERIZATION TECHNIQUES; ENERGY CALCULATION; ENERGY CONFIGURATIONS; EXPERIMENTAL DATA; FABRICATION PROCESS; GROWTH MECHANISMS; HRTEM; IMAGE SIMULATIONS; MATERIAL FEATURES; MATERIALS SCIENTIST; NANOCRYSTALLINE SYSTEMS; NANOSTRUCTURED SYSTEMS; QUANTITATIVE CHARACTERIZATION; RELIABLE MODELS; STEPPING STONE; SYNTHESIS PROCEDURE;

ATOMS; CALCULATIONS; CHEMICAL ANALYSIS; CHEMICAL ELEMENTS; INTERFACIAL ENERGY; MATERIALS PROPERTIES; MORPHOLOGY; THREE DIMENSIONAL;

NANOCRYSTALS;

EID: 84864845757     PISSN: 17433533     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.2495/MC110041     Document Type: Conference Paper

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