Direct compositional analysis of AlGaAs/GaAs heterostructures by the reciprocal space segmentation of high-resolution micrographs

Ultramicroscopy

Volumn 93, Issue 2, 2002, Pages 123-137

  Tillmann, K ^a   Luysberg, M ^a   Specht, P ^b   Weber, E R ^b  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

^b No 1760   (United States)

Author keywords

Digital image processing; High resolution transmission electron microscopy; Interdiffusion; Layer stoichiometry

Indexed keywords

FOURIER TRANSFORMS; HEAT TREATMENT; IMAGING TECHNIQUES; MAPPING; SEMICONDUCTOR QUANTUM WELLS; SIGNAL TO NOISE RATIO;

REAL SPACE TECHNIQUE;

HETEROJUNCTIONS;

ALUMINUM DERIVATIVE; ARSENIC DERIVATIVE; GALLIUM;

ANALYTIC METHOD; ARTICLE; CHEMICAL ANALYSIS; CHEMICAL COMPOSITION; CHEMICAL STRUCTURE; EXTRACTION; FOURIER TRANSFORMATION; IMAGE ANALYSIS; IMAGE PROCESSING; IMAGE QUALITY; LOW TEMPERATURE PROCEDURES; PARAMETER; QUANTUM CHEMISTRY; SIGNAL NOISE RATIO; THERMAL EXPOSURE; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0036837316     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(02)00153-5     Document Type: Article

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