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Volumn 11, Issue 17, 2009, Pages 3144-3151

Voltage-assisted 18O tracer incorporation into oxides for obtaining shallow diffusion profiles and for measuring ionic transference numbers: Basic considerations

Author keywords

[No Author keywords available]

Indexed keywords


EID: 64949190027     PISSN: 14639076     EISSN: None     Source Type: Journal    
DOI: 10.1039/b822415c     Document Type: Article
Times cited : (27)

References (22)
  • 9
    • 0004020231 scopus 로고
    • Oxford University Press, Oxford, 2nd edn, p. 36
    • J. Crank, The Mathematics of Diffusion, Oxford University Press, Oxford, 2nd edn, 1975, p. 36
    • (1975) The Mathematics of Diffusion
    • Crank, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.