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Volumn 11, Issue 17, 2009, Pages 3144-3151
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Voltage-assisted 18O tracer incorporation into oxides for obtaining shallow diffusion profiles and for measuring ionic transference numbers: Basic considerations
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 64949190027
PISSN: 14639076
EISSN: None
Source Type: Journal
DOI: 10.1039/b822415c Document Type: Article |
Times cited : (27)
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References (22)
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