Direct identification of metallic and semiconducting single-walled carbon nanotubes in scanning electron microscopy

Nano Letters

Volumn 12, Issue 8, 2012, Pages 4095-4101

  Li, Jie ^a   He, Yujun ^a   Han, Yimo ^a   Liu, Kai ^a   Wang, Jiaping ^a   Li, Qunqing ^a   Fan, Shoushan ^a   Jiang, Kaili ^a  

^a TSINGHUA UNIVERSITY   (China)

Author keywords

Carbon nanotube; identification; metallic; scanning electron microscopy; semiconducting

Indexed keywords

DIRECT IDENTIFICATIONS; ELECTRICAL AND OPTICAL PROPERTIES; FORCE MICROSCOPY; METALLIC; OPTOELECTRONIC APPLICATIONS; PEAK FORCE; SCANNING ELECTRONS; SEMICONDUCTING;

CARBON NANOTUBES; ELECTRIC PROPERTIES; FIELD EFFECT TRANSISTORS; IDENTIFICATION (CONTROL SYSTEMS); OPTICAL PROPERTIES; SCANNING ELECTRON MICROSCOPY;

SINGLE-WALLED CARBON NANOTUBES (SWCN);

EID: 84864656805     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl301561f     Document Type: Article

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