Image contrast enhancement in field-emission scanning electron microscopy of single-walled carbon nanotubes

Applied Surface Science

Volumn 255, Issue 7, 2009, Pages 4341-4346

  Zhou, Y S ^a   Yi, K J ^a   Mahjouri Samani, M ^a   Xiong, W ^a   Lu, Y F ^a   Liou, S H ^a  

^a UNIVERSITY OF NEBRASKA LINCOLN   (United States)

Author keywords

Field emission scanning electron microscopy; Single walled carbon nanotubes

Indexed keywords

ELECTRON EMISSION; ELECTRONS; FIELD EMISSION; FIELD EMISSION MICROSCOPES; IMAGE ENHANCEMENT; SCANNING ELECTRON MICROSCOPY; SILICA; SURFACE POTENTIAL; YARN;

ELECTRON BEAM IRRADIATION; FIELD EMISSION SCANNING ELECTRON MICROSCOPES; FIELD EMISSION SCANNING ELECTRON MICROSCOPY; IMAGE CONTRAST ENHANCEMENT; POTENTIAL DIFFERENCE; PRIMARY ELECTRONS; SINGLE-WALLED CARBON NANOTUBE (SWNTS); SIO2 SURFACE;

SINGLE-WALLED CARBON NANOTUBES (SWCN);

EID: 58149092116     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2008.11.035     Document Type: Article

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