Structural (n, m) determination of isolated single-wall carbon nanotubes by resonant Raman scattering

Physical Review Letters

Volumn 86, Issue 6, 2001, Pages 1118-1121

  Jorio, A ^a   Saito, R ^d   Hafner, J H ^e   Lieber, C M ^e   Hunter, M ^a   McClure, T ^b   Dresselhaus, G ^c   Dresselhaus, M S ^a  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^b Massachusetts Institute of Technology Cambridge   (United States)

^c MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^d UNIVERSITY OF ELECTRO COMMUNICATIONS   (Japan)

^e HARVARD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CATALYSTS; CHEMICAL VAPOR DEPOSITION; ELECTRON TRANSITIONS; IRON; MOLECULAR STRUCTURE; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SILICA; SILICON; SURFACES; TRANSMISSION ELECTRON MICROSCOPY;

CHIRALITY; ISOLATED SINGLE WALL CARBON NANOTUBES; LASER EXCITATION; RADIAL BREATHING MODE FREQUENCY; RESONANT CONFOCAL MICRO RAMAN SPECTROSCOPY; RESONANT RAMAN SCATTERING; THEORY OF RESONANT TRANSITIONS;

CARBON NANOTUBES;

EID: 0035251555     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.86.1118     Document Type: Article

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