SCOPUS 정보 검색 플랫폼

Volumn 19, Issue 33, 2008, Pages

Charge contrast imaging of suspended nanotubes by scanning electron microscopy

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON MICROSCOPES; IMAGING TECHNIQUES; MECHANISMS; NANOPORES; NANOSTRUCTURED MATERIALS; NANOSTRUCTURES; NANOTUBES; SCANNING ELECTRON MICROSCOPY;

CHARGE CONTRAST IMAGING; CONTRAST MECHANISMS; HIGH CONTRAST (HC); NANO STRUCTURING; NANO TUBE;

SCANNING;

NANOMATERIAL; NANOTUBE;

ARTICLE; IMAGE DISPLAY; IMAGE ENHANCEMENT; IMAGE QUALITY; NANOIMAGING; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY; SURFACE PROPERTY; VISIBILITY;

EID: 47349126581 PISSN: 09574484 EISSN: 13616528 Source Type: Journal
DOI: 10.1088/0957-4484/19/33/335202 Document Type: Article

Times cited : (21)

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