SCOPUS 정보 검색 플랫폼

Journal of Physics D: Applied Physics

Volumn 45, Issue 31, 2012, Pages

Elastic photoelectron scattering effects in the XPS analysis of stratified samples

(1) Jablonski, A a

a INSTITUTE OF PHYSICAL CHEMISTRY (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

BULK MATERIALS; BURIED LAYER; DEPTH PROFILE; ELASTIC PHOTOELECTRON SCATTERING; ELASTIC-SCATTERING EVENTS; MONTE CARLO SIMULATION; MULTI-LAYER SYSTEM; MULTILAYER MATERIALS; PHOTOELECTRON TRANSPORT; THEORETICAL MODELS; XPS ANALYSIS;

AUGER ELECTRON SPECTROSCOPY; ELASTIC SCATTERING; MONTE CARLO METHODS; MULTILAYERS; PHOTONS; X RAY PHOTOELECTRON SPECTROSCOPY;

PHOTOELECTRONS;

EID: 84864195155 PISSN: 00223727 EISSN: 13616463 Source Type: Journal
DOI: 10.1088/0022-3727/45/31/315302 Document Type: Article

Times cited : (11)

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