SCOPUS 정보 검색 플랫폼

Surface Science

Volumn 605, Issue 15-16, 2011, Pages 1556-1562

Core hole and surface excitation correction parameter for XPS peak intensities

(2) Pauly, N a Tougaard, S b

a UNIVERSITÉ LIBRE DE BRUXELLES (Belgium)

b UNIVERSITY OF SOUTHERN DENMARK (Denmark)

Author keywords

Core hole effect; Dispersion relation; Intrinsic excitation; Surface excitation; XPS

Indexed keywords

DISPERSION (WAVES); DISPERSIONS; ELECTRON ENERGY ANALYZERS; ELECTRON SCATTERING; ENERGY DISSIPATION; ENERGY GAP; PHOTOELECTRONS; PHOTONS; WIDE BAND GAP SEMICONDUCTORS;

CORE HOLE; DIELECTRIC RESPONSE THEORY; DISPERSION RELATIONS; ENERGY LOSS FUNCTION; INELASTIC ELECTRON SCATTERING CROSS SECTIONS; PHOTO-EXCITATION PROCESS; SURFACE EXCITATIONS; WAVE-VECTOR DISPERSION;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 79959853666 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/j.susc.2011.05.030 Document Type: Article

Times cited : (8)

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