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Volumn 601, Issue 16, 2007, Pages 3409-3420

Angle-resolved elastic peak electron spectroscopy: Role of surface excitations

Author keywords

Amorphous surfaces; Computer simulations; Electron spectroscopy; Electron solid interactions; Electron solid scattering and transmission elastic; Monte Carlo simulations

Indexed keywords

BACKSCATTERING; COMPUTER SIMULATION; ELECTRON SCATTERING; ELECTRON SPECTROSCOPY; ENERGY DISSIPATION; MATHEMATICAL MODELS; MONTE CARLO METHODS;

EID: 34547699999     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2007.05.064     Document Type: Article
Times cited : (18)

References (31)
  • 10
    • 34547681015 scopus 로고    scopus 로고
    • ISO Standard 18115: Surface Chemical Analysis - Vocabulary, International Organization for Standardization, Geneva, 2001.
  • 18
    • 34547701390 scopus 로고    scopus 로고
    • R. Oswald, Numerische Untersuchung der elastischen Streuung von Elektronen an Atomen und ihrer Rückstreuung an Oberflächen amorpher Substanzen im Energiebereich unter 2000 eV, PhD Thesis, Fakultät für Physik, Eberhard-Karls-Universität, Tübingen, 1992.
  • 23
    • 34547669786 scopus 로고    scopus 로고
    • A. Jablonski, F. Salvat, C.J. Powell, NIST Electron Elastic-Scattering Cross-Section Database, Version 3.1, Standard Reference Data Program Database 64, US Department of Commerce, National Institute of Standards and Technology, Gaithersburg, MD, 2003. Web address: .
  • 25
    • 34547664310 scopus 로고    scopus 로고
    • C.J. Powell, A. Jablonski, NIST Electron Inelastic-Mean-Free-Path Database, Version 1.0, Standard Reference Data Program Database 71, US Department of Commerce, National Institute of Standards and Technology, Gaithersburg, MD, 1999.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.