Propagation of nanoscale ripples on ion-irradiated surfaces

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 285, Issue , 2012, Pages 142-147

  Gnaser, Hubert ^a   Reuscher, Bernhard ^a   Zeuner, Anna ^a  

^a University of Koblenz Landau   (Germany)

Author keywords

Ion bombardment; Sputtering; Surface nanostructures

Indexed keywords

EX-SITU ATOMIC FORCE MICROSCOPY; FLUENCES; FOCUSED-ION-BEAM SYSTEM; GLASS SURFACES; IN-SITU; ION FLUENCES; NANO SCALE; OBLIQUE INCIDENCE; PROPAGATION VELOCITIES; RIPPLE STRUCTURE; SCANNING ELECTRON MICROSCOPE; SURFACE NANOSTRUCTURE;

ATOMIC FORCE MICROSCOPY; ION BOMBARDMENT; SCANNING ELECTRON MICROSCOPY; SPUTTERING;

NANOSTRUCTURES;

EID: 84863714570     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2012.05.028     Document Type: Article

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