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Physical Review B - Condensed Matter and Materials Physics

Volumn 65, Issue 11, 2002, Pages 1153271-1153276

Ripple propagation and velocity dispersion on ion-beam-eroded silicon surfaces

(4) Habenicht, S a Lieb, K P a Koch, J b Wieck, A D b

a UNIVERSITY OF GÖTTINGEN (Germany)

b RUHR UNIVERSITY BOCHUM (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

GALLIUM; SILICON;

ARTICLE; CALCULATION; CHEMICAL ANALYSIS; ELECTRON; IMAGE ANALYSIS; MONTE CARLO METHOD; PHYSICS; SCANNING ELECTRON MICROSCOPY; TECHNOLOGY; VELOCITY;

EID: 0037088081 PISSN: 01631829 EISSN: None Source Type: Journal
DOI: 10.1103/PhysRevB.65.115327 Document Type: Article

Times cited : (115)

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