Error detection and recovery techniques for variation-aware CMOS computing: A comprehensive review

Journal of Low Power Electronics and Applications

Volumn 1, Issue 3, 2011, Pages 334-356

  Crop, Joseph ^a   Krimer, Evgeni ^b   Moezzi Madani, Nariman ^a   Pawlowski, Robert ^a   Ruggeri, Thomas ^a   Chiang, Patrick ^a   Erez, Mattan ^b  

^a OREGON STATE UNIVERSITY   (United States)

^b UNIVERSITY OF TEXAS AT AUSTIN   (United States)

Author keywords

Error detection; Error recovery; Variation tolerance

Indexed keywords

EID: 84863545254     PISSN: None     EISSN: 20799268     Source Type: Journal    
DOI: 10.3390/jlpea1030334     Document Type: Article

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