Measurement of a timing error detection latch capable of sub-threshold operation

2009 NORCHIP

Volumn , Issue , 2009, Pages

  Turnquist, Matthew J ^a   Laulainen, Erkka ^a   Makipaa, Jani ^b   Pulkkinen, Mika ^a   Koskinen, Lauri ^a  

^a AALTO UNIVERSITY   (Finland)

^b VTT TECHNICAL RESEARCH CENTRE OF FINLAND   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

ADAPTIVE METHODS; CMOS PROCESSS; ERROR RATE; MATRIX; MINIMUM ENERGY; MINIMUM ENERGY POINT; SAFETY MARGIN; SUBTHRESHOLD; SUBTHRESHOLD OPERATION; SUPPLY VOLTAGES; TEST CIRCUIT; TIMING ERROR DETECTION; TIMING ERRORS;

ADAPTIVE SYSTEMS; CMOS INTEGRATED CIRCUITS; DRAIN CURRENT; SENSITIVITY ANALYSIS; TIME MEASUREMENT;

ERROR DETECTION;

EID: 77949573723     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/NORCHP.2009.5397791     Document Type: Conference Paper

References (8)

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