Quantitative high-angle annular dark-field scanning transmission electron microscope (HAADF-STEM) tomography and high-resolution electron microscopy of unsupported intermetallic GaPd 2 catalysts

Journal of Physical Chemistry C

Volumn 116, Issue 24, 2012, Pages 13343-13352

  Leary, Rowan ^a   Saghi, Zineb ^a   Armbrüster, Marc ^b   Wowsnick, Gregor ^b   Schlögl, Robert ^c   Thomas, John Meurig ^a   Midgley, Paul A ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^b MAX PLANCK INSTITUTE FOR CHEMICAL PHYSICS OF SOLIDS   (Germany)

^c FRITZ HABER INSTITUT DER MAX PLANCK GESELLSCHAFT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

3D CHARACTERIZATION; ELECTRON TOMOGRAMS; ELECTRON TOMOGRAPHY; EQUIVALENT DIAMETER; HAADF-STEM; HIGH-ANGLE ANNULAR DARK FIELDS; IMAGE PROCESSING TECHNIQUE; INDIVIDUAL SIZE; LARGE AGGLOMERATE; NANO SCALE; SCANNING TRANSMISSION ELECTRON MICROSCOPES; SELECTIVE HYDROGENATION; STRUCTURAL MORPHOLOGY;

AGGLOMERATION; ELECTRIC IMPEDANCE TOMOGRAPHY; IMAGE PROCESSING; NANOPARTICLES; THREE DIMENSIONAL; TRANSMISSION ELECTRON MICROSCOPY;

CATALYSTS;

EID: 84863303951     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp212456z     Document Type: Article

References (50)

1. Armbrüster, M.; Kovnir, K.; Behrens, M.; Teschner, D.; Grin, Y.; Schlögl, R. J. Am. Chem. Soc. 2010, 132, 14745-14747.
2. Lindlar, H. Helv. Chim. Acta 1952, 35, 446-450.
3. Stachurski, J.; Thomas, J. M. Catal. Lett. 1988, 1, 67-72.
4. Zea, H.; Lester, K.; Datye, A. K.; Rightor, E.; Gulotty, R.; Waterman, W.; Smith, M. Appl. Catal. A 2005, 282, 237-245.
5. Studt, F.; Abild-Pedersen, F.; Bligaard, T.; Sørensen, R. Z.; Christensen, C. H.; Nørskov, J. K. Science 2008, 320, 1320-1322.
6. Ota, A.; Armbrüster, M.; Behrens, M.; Rosenthal, D.; Friedrich, M.; Kasatkin, I.; Girgsdies, F.; Zhang, W.; Wagner, R.; Schlögl, R. J. Phys. Chem. C 2010, 115, 1368-1374.
7. Thomas, J. M.; Midgley, P. A. ChemCatChem 2010, 2, 783-798.
8. Gai, P. L.; Boyes, E. D. Electron Microscopy in Heterogeneous Catalysis; Institute of Physics Publishing: Bristol, U.K. 2003.
9. Liu, J. Microsc. Microanal. 2004, 10, 55-76.
10. Batson, P. E.; Dellby, N.; Krivanek, O. L. Nature 2002, 418, 617-620.
11. Haider, M.; Uhlemann, S.; Schwan, E.; Rose, H.; Kabius, B.; Urban, K. Nature 1998, 392, 768-769.
12. Müller, H.; Uhlemann, S.; Hartel, P.; Haider, M. Microsc. Microanal. 2006, 12, 442-455.
13. Pennycook, S. J.; Nellist, P. D. Scanning Transmission Electron Microscopy; Springer: New York, 2011.
14. Weyland, M.; Midgley, P. A.; Thomas, J. M. J. Phys. Chem. B 2001, 105, 7882-7886.
15. Thomas, J. M.; Midgley, P. A.; Yates, T. J. V.; Barnard, J. S.; Raja, R.; Arslan, I.; Weyland, M. Angew. Chem. Int. Ed. 2004, 43, 6745-6747.
16. Midgley, P. A.; Weyland, M.; Thomas, J. M.; Johnson, B. F. G. Chem. Commun. 2001, 907-908.
17. Zhou, W.; Wachs, I. E.; Kiely, C. J. Curr. Opin. Solid State Mater. Sci. 2012, 16, 10-22.
18. Crozier, P. A. Nanocharacterization of Heterogeneous Catalysts by Ex Situ and In Situ STEM. In Scanning Transmission Electron Microscopy; Pennycook, S. J., Nellist, P. D., Eds.; Springer: New York, 2011; pp 537-582.
19. Midgley, P. A.; Weyland, M. Ultramicroscopy 2003, 96, 413-431.
20. Midgley, P. A.; Dunin-Borkowski, R. E. Nat. Mater. 2009, 8, 271-280.
21. Midgley, P. A.; Ward, E. P. W.; Hungria, A. B.; Thomas, J. M. Chem. Soc. Rev. 2007, 36, 1477-1494.
22. Friedrich, H.; de Jongh, P. E.; Verkleij, A. J.; de Jong, K. P. Chem. Rev. 2009, 109, 1613-1629.
23. Ward, E. P. W.; Yates, T. J. V.; Fernández, J.-J.; Vaughan, D. E. W.; Midgley, P. A. J. Phys. Chem. C 2007, 111, 11501-11505.
24. Arslan, I.; Yates, T. J. V.; Browning, N. D.; Midgley, P. A. Science 2005, 309, 2195-2198.
25. Batenburg, K. J.; Bals, S.; Sijbers, J.; Kübel, C.; Midgley, P. A.; Hernandez, J. C.; Kaiser, U.; Encina, E. R.; Coronado, E. A.; Van Tendeloo, G. Ultramicroscopy 2009, 109, 730-740.
26. Saghi, Z.; Holland, D. J.; Leary, R.; Falqui, A.; Bertoni, G.; Sederman, A. J.; Gladden, L. F.; Midgley, P. A. Nano Lett. 2011, 11, 4666-4673.
27. Armbrüster, M.; Wowsnick, G.; Friedrich, M.; Heggen, M.; Cardoso-Gil, R. J. Am. Chem. Soc. 2011, 133, 9112-9118.
28. Okamoto, H. J. Phase Equilib. Diffus. 2008, 29, 466-467.
29. Kovnir, K.; Schmidt, M.; Waurisch, C.; Armbruster, M.; Prots, Y.; Grin, Y. Z. Kristallogr. - New Cryst. Struct. 2008, 223, 7-8.
30. Schubert, K.; Lukas, H. L.; Meissner, H. G.; Bhan, S. Z. Metallkd. 1959, 50, 534-540.
31. Wannek, C.; Harbrecht, B. J. Alloys Compd. 2001, 316, 99-106.
32. Shao, L.; Zhang, W.; Armbrüster, M.; Teschner, D.; Girgsdies, F.; Zhang, B.; Timpe, O.; Friedrich, M.; Schlögl, R.; Su, D. S. Angew. Chem. Int. Ed. 2011, 50, 10231-10235.
33. Gryaznov, V. G.; Kaprelov, A. M.; Romanov, A. E.; Polonskii, I. A. Phys. Status Solidi B 1991, 167, 441-450.
34. Gryaznov, V. G.; Heydenreich, J.; Kaprelov, A. M.; Nepijko, S. A.; Romanov, A. E.; Urban, J. Cryst. Res. Technol. 1999, 34, 1091-1119.
35. Hofmeister, H. Cryst. Res. Technol. 1998, 33, 3-25.
36. Marks, L. D. Rep. Prog. Phys. 1994, 57, 603.
37. Mayoral, A.; Barron, H.; Estrada-Salas, R.; Vazquez-Duran, A.; Jose-Yacaman, M. Nanoscale 2010, 2, 335-342.
38. Bagley, B. G. Nature 1965, 208, 674-675.
39. Yang, C. Y. J. Cryst. Growth 1979, 47, 274-282.
40. de Wit, R. J. Phys. C: Solid State Phys. 1972, 5, 529.
41. Johnson, C. L.; Snoeck, E.; Ezcurdia, M.; Rodriguez-Gonzalez, B.; Pastoriza-Santos, I.; Liz-Marzan, L. M.; Hytch, M. J. Nat. Mater. 2008, 7, 120-124.
42. Friedrich, H.; Guo, S.; de Jongh, P. E.; Pan, X.; Bao, X.; de Jong, K. P. ChemSusChem 2011, 4, 957-963.
43. Russ, J. C. The Image Processing Handbook; CRC Press: Boca Raton, FL, 2002.
44. Ohser, J.; Schladitz, K. 3D Images of Materials Structures: Processing and Analysis; Wiley-VCH: Weinheim, Germany, 2009.
45. Wang, X. Y.; Lockwood, R.; Malac, M.; Furukawa, H.; Li, P.; Meldrum, A. Ultramicroscopy 2012, 113, 96-105.
46. Zürner, A.; Döblinger, M.; Cauda, V.; Wei, R.; Bein, T. Ultramicroscopy 2012, 115, 41-49.
47. Roelandts, T.; Batenburg, K. J.; Biermans, E.; Kübel, C.; Bals, S.; Sijbers, J. Ultramicroscopy 2012, 114, 96-105.
48. Lange, A.; Kupsch, A.; Hentschel, M. P.; Manke, I.; Kardjilov, N.; Arlt, T.; Grothausmann, R. J. Power Sources 2011, 196, 5293-5298.
49. Goris, B.; Van den Broek, W.; Batenburg, K. J.; Heidari Mezerji, H.; Bals, S. Ultramicroscopy 2012, 113, 120-130.
50. Grothausmann, R.; Zehl, G.; Manke, I.; Fiechter, S.; Bogdanoff, P.; Dorbandt, I.; Kupsch, A.; Lange, A.; Hentschel, M. P.; Schumacher, G.; Banhart, J. J. Am. Chem. Soc. 2011, 133, 18161-18171.