Quantitative structural assessment of heterogeneous catalysts by electron tomography

Journal of the American Chemical Society

Volumn 133, Issue 45, 2011, Pages 18161-18171

  Grothausmann, Roman ^a   Zehl, Gerald ^a   Manke, Ingo ^a   Fiechter, Sebastian ^a   Bogdanoff, Peter ^a   Dorbandt, Iris ^a   Kupsch, Andreas ^b   Lange, Axel ^b   Hentschel, Manfred P ^b   Schumacher, Gerhard ^a   Banhart, John ^a  

^a HAHN MEITNER INSTITUT   (Germany)

^b BAM FEDERAL INSTITUTE FOR MATERIALS RESEARCH AND TESTING   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ACCESSIBLE SURFACE AREAS; ELECTRON TOMOGRAPHY; FUEL CELL CATALYSTS; HETEROGENEOUS CATALYST; LOCAL ORIENTATIONS; MORPHOLOGICAL STUDY; OXYGEN REDUCTION REACTION; SHAPE ANALYSIS; SPHERICAL SYMMETRY; STRUCTURAL ASSESSMENTS; STRUCTURE FORMATIONS; SURFACE-TO-VOLUME RATIO; TRANSMISSION ELECTRON MICROSCOPE;

DIRECT METHANOL FUEL CELLS (DMFC); ELECTRIC IMPEDANCE TOMOGRAPHY; ELECTROLYTIC REDUCTION; METHANOL; METHANOL FUELS; RUTHENIUM; THREE DIMENSIONAL; TRANSMISSION ELECTRON MICROSCOPY;

CATALYSTS;

RUTHENIUM;

ARTICLE; CATALYST; ELECTRON TOMOGRAPHY; MICROBIAL FUEL CELL; MICROTECHNOLOGY; OXIDATION REDUCTION REACTION; QUANTITATIVE ANALYSIS; STRUCTURE ANALYSIS; THREE DIMENSIONAL IMAGING;

EID: 80755126615     PISSN: 00027863     EISSN: 15205126     Source Type: Journal    
DOI: 10.1021/ja2032508     Document Type: Article

References (61)

1. Srinivasan, S.; Ticianelli, E.; Derouin, C.; Redondo, A. J. Power Sources 1988, 22, 359-375
2. Alonso-Vante, N.; Tributsch, H.; Solorza-Feria, O. Electrochim. Acta 1995, 40, 567-576
3. Trapp, V.; Christensen, P.; Hamnett, A. J. Chem. Soc., Faraday Trans. 1996, 92, 4311-4319
4. Rodríguez, F. J.; Sebastian, P. J.; Solorza, O.; Pérez, R. Int. J. Hydrogen Energy 1998, 23, 1031-1035
5. Zehl, G.; Bogdanoff, P.; Dorbandt, I.; Fiechter, S.; Wippermann, K.; Hartnig, C. J. Appl. Electrochem. 2007, 37, 1475-1484
6. Wippermann, K.; Richter, B.; Klafki, K.; Mergel, J.; Zehl, G.; Dorbandt, I.; Bogdanoff, P.; Fiechter, S.; Kaytakoglu, S. J. Appl. Electrochem. 2007, 37, 1399-1411
7. Papageorgopoulos, D. C.; Liu, F.; Conrad, O. Electrochim. Acta 2007, 52, 4982-4986
8. Comyns, A. E., Ed. Focus on Catalysts; 2007, 10.1016/S1351-4180(07)70248- 9.
9. Alonso-Vante, N. Fuel Cells 2006, 6, 182-189
10. Cao, D.; Wieckowski, A.; Inukai, J.; Alonso-Vante, N. J. Electrochem. Soc. 2006, 153, A869-A874
11. Zehl, G.; Schmithals, G.; Hoell, A.; Haas, S.; Hartnig, C.; Dorbandt, I.; Bogdanoff, P.; Fiechter, S. Angew. Chem., Int. Ed. 2007, 46, 7311-7314
12. Fiechter, S.; Dorbandt, I.; Bogdanoff, P.; Zehl, G.; Schulenburg, H.; Tributsch, H. J. Phys. Chem. C 2007, 111, 477-487
13. Bartram, S. F. In Handbook of X-Rays; Kaelble, E. F., Ed.; McGraw-Hill: New York, 1967; Chapter 17, pp 17.1-17.18.
14. Frank, J. Electron Tomography: Methods for Three-Dimensional Visualization of Structures in the Cell, 2 nd ed.; Springer: Berlin, 2006; p 455.
15. Banhart, J., Ed. Advanced Tomographic Methods in Materials Research and Engineering; Oxford University Press: New York, 2008; pp 1-480.
16. Kübel, C.; Voigt, A.; Schoenmakers, R.; Otten, M.; Su, D.; Lee, T.-C.; Carlsson, A.; Bradley, J. Microsc. Microanal. 2005, 11, 378-400
17. Friedrich, H.; Sietsma, J. R. A.; de Jongh, P. E.; Verkleij, A. J.; de Jong, K. P. J. Am. Chem. Soc. 2007, 129, 10249-10254
18. Friedrich, H.; de Jongh, P. E.; Verkleij, A. J.; de Jong, K. P. Chem. Rev. 2009, 109, 1613-1629
19. Midgley, P. A.; Dunin-Borkowski, R. R. Nat. Mater. 2009, 271-280
20. Midgley, P. A.; Weyland, M.; Thomas, J. M.; Gai, P. L.; Boyes, E. D. Angew. Chem. 2002, 114, 3804-3807
21. Weyland, M.; Midgley, P. A.; Thomas, J. M. J. Phys. Chem. B 2001, 105, 7882-7886
22. Hata, S.; Kimura, K.; Gao, H.; Matsumura, S.; Doi, M.; Moritani, T.; Barnard, J. S.; Tong, J. R.; Sharp, J. H.; Midgley, P. A. Adv. Mater. 2008, 20, 1905-1909
23. Rösner, H.; Scherer, T.; Wilde, G. Scr. Mater. 2009, 60, 168-170
24. Gontard, L. C.; Dunin-Borkowski, R. E.; Chong, R. K. K.; Ozkaya, D.; Midgley, P. A. J. Phys.: Conf. Ser. 2006, 26, 203-206
25. Shirai, M.; Tsumori, K.; Kutsuwada, M.; Yasuda, K.; Matsumura, S. Nucl. Instrum. Methods Phys. Res., Sect. B 2009, 267, 1787-1791
26. Rösner, H.; Parida, S.; Kramer, D.; Volkert, C. A.; Weissmuller, J. Adv. Eng. Mater. 2007, 9, 535-541
27. Friedrich, H.; Guo, S.; de Jongh, P. E.; Pan, X.; Bao, X.; de Jong, K. P. ChemSusChem 2011, 4 (7) 957-963
28. Kübel, C.; Niemeyer, D.; Cieslinski, R.; Rozeveld, S. Material Science Forum, THERMEC 2009, 6th International Conference on Processing & Manufacturing of Advanced Materials. Chandra, T.; Wanderka, N.; Reimers, W.; Ionescu, M., Eds.; 2010; Vol. 638-642, pp 2517-2522.
29. Ward, E. P. W.; Yates, T. J. V.; Fernandez, J. J.; Vaughan, D. E. W.; Midgley, P. A. J. Phys. Chem. C 2007, 111, 11501-11505
30. Grothausmann, R.; Manke, I.; Zehl, G.; Dorbandt, I.; Bogdanoff, P.; Fiechter, S.; Hentschel, M. P.; Lange, A.; Kupsch, A.; Hilger, A.; Banhart, J. MP Mater. Test. 2010, 52, 706-711
31. Nagabhushana, K. S.; Dinjus, E.; Bonnemann, H.; Zaikovskii, V.; Hartnig, C.; Zehl, G.; Dorbandt, I.; Fiechter, S.; Bogdanoff, P. J. Appl. Electrochem. 2007, 37, 1515-1522
32. Lange, A.; Hentschel, M. P.; Kupsch, A. MP Mater. Test. 2008, 50, 272-277
33. Vulcan XC-72R, Cabot Corporation, 2002.
34. Brunauer, S.; Emmett, P. H.; Teller, E. J. Am. Chem. Soc. 1938, 60, 309-319
35. Barrett, E. P.; Joyner, L. G.; Halenda, P. P. J. Am. Chem. Soc. 1951, 73, 373-380
36. Lippens, B. C.; de Boer, J. H. J. Catal. 1965, 4, 319-323
37. Zehl, G.; Dorbandt, I.; Schmithals, G.; Radnik, J.; Wippermann, K.; Richter, B.; Bogdanoff, P.; Fiechter, S. ECS Trans. 2006, 3, 1261-1270
38. Koster, A.; van den Bos, A.; van der Mast, K. Ultramicroscopy 1987, 21, 209-222
39. Koster, A.; de Ruijter, W.; van den Bos, A.; van der Mast, K. Ultramicroscopy 1989, 27, 251-272
40. Kremer, J. R.; Mastronarde, D. N.; McIntosh, J. R. J. Struct. Biol. 1996, 116, 71-76
41. Lange, A.; Kupsch, A.; Hentschel, M. P.; Manke, I.; Kardjilov, N.; Arlt, T.; Grothausmann, R. J. Power Sources 2011, 196, 5293-5298
42. Hentschel, M. P.; Lange, A.; Kupsch, A.; Müller, B. R. MP Mater. Test. 2010, 52, 668-675
43. Otsu, N. IEEE Trans. Syst., Man Cybernet. 1979, 9, 62-66
44. ITK development team, ITK, open source, 3.18, http://www.itk.org.
45. VTK development team, VTK, open source, 5.4; http://www.vtk.org.
46. Eaton, J. W.; GNU Octave, open source, 3.0.5; http://www.gnu.org/ software/octave.
47. Kelley, W. C. gnuplot, open source, 4.4; 2010; http://gnuplot. sourceforge.net/docs-4.4/gnuplot.pdf.
48. Blender, open source, 2.49; Blender Foundation: Amsterdam; http://www.blender.org.
49. Beare, R.; Lehmann, G. Insight J. 2006, 92, 1-24
50. Soille, P. Morphological Image Analysis: Principles and Applications, 2 nd ed.; Springer: New York, 2004; p 391.
51. Wissler, M. J. Power Sources 2006, 156, 142-150
52. Midgley, P. A.; Thomas, J. M.; Laffont, L.; Weyland, M.; Raja, R.; Johnson, B. F. G.; Khimyak, T. J. Phys. Chem. B 2004, 108, 4590-4592
53. Ziegel, J.; Kiderlen, M. Image Vision Comput. 2010, 28, 64-77
54. Nielsen, R. M.; Murphy, S.; Strebel, C.; Johansson, M.; Chorkendorff, I.; Nielsen, J. H. J. Nanopart. Res. 2010, 12, 1249-1262
55. Lehmann, G. Insight J. 2008, 176, 1-34
56. Padfield, D.; Miller, J. Insight J. 2008, 301, 1-13
57. Lorensen, W. E.; Cline, H. E. Comput. Graphics 1987, 21, 163-169
58. Schroeder, W. J.; Martin, K. M.; Lorensen, W. E. The VTK Users Guide, 11 th ed.; Kitware, Inc.: Clifton Park, NY, USA, 2010; pp 1-528.
59. Kinoshita, K. Carbon: Electrochemical and Physicochemical Properties; Wiley & Sons: New York, 1988; pp 1-560.
60. Rouquerol, J.; Avnir, D.; Fairbridge, C. W.; Everett, D. H.; Haynes, J. M.; Pernicone, N.; Ramsay, J. D. F.; Sing, K. S. W.; Unger, K. K. Pure Appl. Chem. 1994, 66, 1739-1758
61. Radermacher, M. J. Electron Microsc. Tech. 1988, 9, 359-394