Conductance statistics from a large array of sub-10 nm molecular junctions

ACS Nano

Volumn 6, Issue 6, 2012, Pages 4639-4647

  Smaali, Kacem ^a   Clément, Nicolas ^a   Patriarche, Gilles ^b   Vuillaume, Dominique ^a  

^a INSTITUT D ELECTRONIQUE   (France)

^b CNRS   (France)

Author keywords

molecular electronics; nanodots; nanoelectronics

Indexed keywords

ALKANETHIOLS; ATOMIC FORCE MICROSCOPE (AFM); CONDUCTANCE VALUES; DECAY CONSTANTS; ENERGY POSITION; LARGE ARRAYS; MOLECULAR JUNCTION; NANODOTS; NANOMETRICS; PEAK-TO-PEAK-; TECHNOLOGICAL CHALLENGES; TRANSIENT VOLTAGE;

ATOMIC FORCE MICROSCOPY; ELECTRODES; MOLECULAR ELECTRONICS; MOLECULAR ORBITALS; NANOELECTRONICS; POWER QUALITY;

MOLECULES;

GOLD; NANOPARTICLE;

ARTICLE; CHEMISTRY; ELECTRIC CONDUCTIVITY; EQUIPMENT; EQUIPMENT DESIGN; INSTRUMENTATION; MATERIALS TESTING; MICROELECTRODE; NANOTECHNOLOGY; PARTICLE SIZE; STATISTICAL ANALYSIS; ULTRASTRUCTURE;

DATA INTERPRETATION, STATISTICAL; ELECTRIC CONDUCTIVITY; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; GOLD; MATERIALS TESTING; MICROELECTRODES; NANOPARTICLES; NANOTECHNOLOGY; PARTICLE SIZE;

EID: 84862885681     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn301850g     Document Type: Article

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