Large array of sub-10-nm single-grain Au nanodots for use in nanotechnology

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Volumn 7, Issue 18, 2011, Pages 2607-2613

  Clément, Nicolas ^a   Patriarche, Gilles ^b   Smaali, Kacem ^a   Vaurette, François ^a   Nishiguchi, Katsuhiko ^c   Troadec, David ^a   Fujiwara, Akira ^c   Vuillaume, Dominique ^a  

^a UNIV LILLE   (France)

^b CNRS   (France)

^c NTT Basic Research Laboratories   (Japan)

Author keywords

electrodes; molecular electronics; nanodots; nanoparticles; ultimate lithography

Indexed keywords

ATOMIC-RESOLUTION; CHEMICAL TECHNIQUES; E-BEAM LITHOGRAPHY; ENERGY DISPERSIVE X RAY SPECTROSCOPY; LARGE ARRAYS; LATERAL RESOLUTION; MOLECULAR ELECTRONIC DEVICE; NANODOTS; NANOMETRICS; PHYSICAL MEASUREMENT; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SELF-ASSEMBLED ORGANIC MONOLAYERS; THERMAL-ANNEALING; ULTIMATE LITHOGRAPHY; UNIFORM ARRAY;

ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; DIFFRACTIVE OPTICS; ELECTRIC CONDUCTANCE; ELECTRON BEAM LITHOGRAPHY; GOLD; MOLECULAR ELECTRONICS; MONOLAYERS; SILICON COMPOUNDS; SILICON OXIDES; TEST FACILITIES; THERMOELECTRIC EQUIPMENT; TRANSMISSION ELECTRON MICROSCOPY; X RAY SPECTROSCOPY;

SINGLE CRYSTALS;

GOLD; METAL NANOPARTICLE; SILICON DIOXIDE;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; METHODOLOGY; NANOTECHNOLOGY; PARTICLE SIZE; SCANNING ELECTRON MICROSCOPY;

GOLD; METAL NANOPARTICLES; MICROSCOPY, ATOMIC FORCE; MICROSCOPY, ELECTRON, SCANNING; NANOTECHNOLOGY; PARTICLE SIZE; SILICON DIOXIDE;

EID: 80052720800     PISSN: 16136810     EISSN: 16136829     Source Type: Journal    
DOI: 10.1002/smll.201100915     Document Type: Article

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