On the many advantages of local-electrode atom probes

Ultramicroscopy

Volumn 62, Issue 1-2, 1996, Pages 29-42

  Kelly, Thomas F ^a   Camus, Patrick P ^a   Larson, David J ^a   Holzman, Louis M ^a   Bajikar, Sateesh S ^a  

^a University of Wisconsin ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACCELERATION; ELECTRIC FIELDS; ION MICROSCOPES; IONS; MICROANALYSIS;

ATOM PROBE FIELD ION MICROSCOPE; ENERGY UNCERTAINTY; ION BEAM MASK ETCHING; LOCAL ELECTRODE ATOM PROBES; LOCAL EXTRACTION ELECTRODES; MICROTIPS;

ELECTRODES;

ARTICLE; ATOM PROBE FIELD ION MICROSCOPY; MICROSCOPY;

EID: 0029995889     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/0304-3991(95)00086-0     Document Type: Article

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