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Volumn 23, Issue 21, 2012, Pages

Few electron limit of n-type metal oxide semiconductor single electron transistors

Author keywords

[No Author keywords available]

Indexed keywords

ADDITION ENERGY; CHANNEL SIZES; CMOS TECHNOLOGY; COMPLEMENTARY METAL-OXIDE-SEMICONDUCTOR TECHNOLOGIES; ELECTRONIC TRANSPORT; FULLY DEPLETED SILICON-ON-INSULATOR; GATE LEVELS; MASSIVE PRODUCTION; METAL OXIDE SEMICONDUCTOR; METAL OXIDES; N TYPE SILICON; PRE-INDUSTRIAL; QUANTUM VARIABLES; SILICON THICKNESS; SPIN DENSITY FUNCTIONAL THEORY; STABILITY DIAGRAM;

EID: 84860634060     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/23/21/215204     Document Type: Article
Times cited : (56)

References (19)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.