-
2
-
-
0032498174
-
A laser ablation method for the synthesis of crystalline semiconductor nanowires
-
DOI 10.1126/science.279.5348.208
-
A.M. Morales, and C.M. Lieber A laser ablation method for the synthesis of crystalline semiconductor nanowires Science 279 1998 208 211 (Pubitemid 28103874)
-
(1998)
Science
, vol.279
, Issue.5348
, pp. 208-211
-
-
Morales, A.M.1
Lieber, C.M.2
-
3
-
-
47249162353
-
Silicon nanowire-based solar cells
-
T. Stelzner, M. Pietsch, G. Andrä, F. Falk, E. Ose, and S. Christiansen Silicon nanowire-based solar cells Nanotechnology 19 2008 295203
-
(2008)
Nanotechnology
, vol.19
, pp. 295203
-
-
Stelzner, T.1
Pietsch, M.2
Andrä, G.3
Falk, F.4
Ose, E.5
Christiansen, S.6
-
4
-
-
77949291009
-
Realization of vertical and zigzag single crystalline silicon nanowire architectures
-
V.A. Sivakov, G. Brönstrup, B. Pecz, A. Berger, G.Z. Radnoczi, M. Krause, and S.H. Christiansen Realization of vertical and zigzag single crystalline silicon nanowire architectures Journal of Physical Chemistry C 114 9 2010 3798 3803
-
(2010)
Journal of Physical Chemistry C
, vol.114
, Issue.9
, pp. 3798-3803
-
-
Sivakov, V.A.1
Brönstrup, G.2
Pecz, B.3
Berger, A.4
Radnoczi, G.Z.5
Krause, M.6
Christiansen, S.H.7
-
5
-
-
78650451389
-
Fabrication of black silicon materials by wet etching and characterization
-
76584S1-76584S-7
-
G. Zhengyu, W. Zhiming, Z. Anyuan, J. Jing, Z. Guodong, and J. Yadong Fabrication of black silicon materials by wet etching and characterization Proceedings of SPIE 7658 2010 76584S1-76584S-7
-
(2010)
Proceedings of SPIE
, vol.7658
-
-
Zhengyu, G.1
Zhiming, W.2
Anyuan, Z.3
Jing, J.4
Guodong, Z.5
Yadong, J.6
-
6
-
-
0029325460
-
The black silicon method: A universal method for determining the parameter setting of a fluorine-based reactive ion etcher in deep silicon trench etching with profile control
-
H. Jansen, M. de Boer, R. Legtenberg, and M. Elwenspoek The black silicon method: a universal method for determining the parameter setting of a fluorine-based reactive ion etcher in deep silicon trench etching with profile control Journal of Micromechanics and Microengineering 5 1995 115 120
-
(1995)
Journal of Micromechanics and Microengineering
, vol.5
, pp. 115-120
-
-
Jansen, H.1
De Boer, M.2
Legtenberg, R.3
Elwenspoek, M.4
-
7
-
-
34547093404
-
Model for a-Si:H/c-Si interface recombination based on the amphoteric nature of silicon dangling bonds
-
S. Olibet, E. Vallat-Sauvain, and C. Ballif Model for a-Si:H/c-Si interface recombination based on the amphoteric nature of silicon dangling bonds Physical Review B 76 2007 035326
-
(2007)
Physical Review B
, vol.76
, pp. 035326
-
-
Olibet, S.1
Vallat-Sauvain, E.2
Ballif, C.3
-
8
-
-
0028761966
-
Atomic layer epitaxy growth of doped zinc oxide thin films from organometals
-
V. Lujala, J. Skarp, M. Tammenmaa, and T. Suntola Atomic layer epitaxy growth of doped zinc oxide thin films from organometals Applied Surface Science 82/83 1994 34 40
-
(1994)
Applied Surface Science
, vol.82-83
, pp. 34-40
-
-
Lujala, V.1
Skarp, J.2
Tammenmaa, M.3
Suntola, T.4
-
9
-
-
33746905528
-
Atomic layer deposition for the conformal coating of nanoporous materials
-
J.W. Elam, G. Xiong, C.Y. Han, H.H. Wang, J.P. Birrell, U. Welp, J.N. Hryn, M.J. Pellin, T.F. Baumann, J.F. Poco, and J.H. Satcher Jr. Atomic layer deposition for the conformal coating of nanoporous materials Journal of Nanomaterials 2006 2006 64501
-
(2006)
Journal of Nanomaterials
, vol.2006
, pp. 64501
-
-
Elam, J.W.1
Xiong, G.2
Han, C.Y.3
Wang, H.H.4
Birrell, J.P.5
Welp, U.6
Hryn, J.N.7
Pellin, M.J.8
Baumann, T.F.9
Poco, J.F.10
Satcher, Jr.J.H.11
-
10
-
-
77955679881
-
Atomic layer deposition of Al-doped Zno films: Effect of grain orientation on conductivity
-
N.P. Dasgupta, S. Neubert, W. Lee, O. Trejo, J.-R. Lee, and F.B. Prinz Atomic layer deposition of Al-doped Zno films: effect of grain orientation on conductivity Chemistry of Materials 22 2010 4769 4775
-
(2010)
Chemistry of Materials
, vol.22
, pp. 4769-4775
-
-
Dasgupta, N.P.1
Neubert, S.2
Lee, W.3
Trejo, O.4
Lee, J.-R.5
Prinz, F.B.6
-
11
-
-
77958450114
-
Deposition of Al doped ZnO layers with various electrical types by atomic layer deposition
-
C.H. Ahn, H. Kim, and H.K. Cho Deposition of Al doped ZnO layers with various electrical types by atomic layer deposition Thin Solid Films 519 2010 747 750
-
(2010)
Thin Solid Films
, vol.519
, pp. 747-750
-
-
Ahn, C.H.1
Kim, H.2
Cho, H.K.3
-
12
-
-
0031553497
-
3 thin film growth on Si(100) using binary reaction sequence chemistry
-
PII S0040609096089341
-
3 thin film growth on Si(100) using binary reaction sequence chemistry Thin Solid Films 292 1997 135 144 (Pubitemid 127368647)
-
(1997)
Thin Solid Films
, vol.292
, Issue.1-2
, pp. 135-144
-
-
Ott, A.W.1
Klaus, J.W.2
Johnson, J.M.3
George, S.M.4
-
13
-
-
21744444606
-
Surface chemistry of atomic layer deposition: A case study for the trimethylaluminium/water process
-
R.L. Puurunen Surface chemistry of atomic layer deposition: a case study for the trimethylaluminium/water process Journal of Applied Physics 97 2005 121301
-
(2005)
Journal of Applied Physics
, vol.97
, pp. 121301
-
-
Puurunen, R.L.1
-
14
-
-
3042595571
-
Advanced electronic and optoelectronic materials by atomic layer deposition: An overview with special emphasis on recent progress in processing of high-k dielectrics and other oxide materials
-
L. Niinistö, J. Päiväsaari, J. Niinistö, M. Putkonen, and M. Nieminen Advanced electronic and optoelectronic materials by atomic layer deposition: an overview with special emphasis on recent progress in processing of high-k dielectrics and other oxide materials Physica Status Solidi A 201 2004 1443 1452
-
(2004)
Physica Status Solidi A
, vol.201
, pp. 1443-1452
-
-
Niinistö, L.1
Päiväsaari, J.2
Niinistö, J.3
Putkonen, M.4
Nieminen, M.5
-
15
-
-
61449262940
-
Influence of substrate temperature and Zn-precursors on atomic layer deposition of polycrystalline ZnO films on glass
-
H. Makino, A. Miyake, T. Yamada, N. Yamamoto, and T. Yamamoto Influence of substrate temperature and Zn-precursors on atomic layer deposition of polycrystalline ZnO films on glass Thin Solid Films 517 2009 3138 3142
-
(2009)
Thin Solid Films
, vol.517
, pp. 3138-3142
-
-
Makino, H.1
Miyake, A.2
Yamada, T.3
Yamamoto, N.4
Yamamoto, T.5
-
17
-
-
21644477594
-
Textured aluminium-doped zinc oxide thin films from atmospheric pressure chemical-vapor deposition
-
J. Hu, and R.G. Gordon Textured aluminium-doped zinc oxide thin films from atmospheric pressure chemical-vapor deposition Journal of Applied Physics 71 1992 880 890
-
(1992)
Journal of Applied Physics
, vol.71
, pp. 880-890
-
-
Hu, J.1
Gordon, R.G.2
-
18
-
-
0033170232
-
Transparent and conductive aluminum doped zinc oxide films prepared by mid-frequency reactive magnetron sputtering
-
DOI 10.1016/S0040-6090(99)00158-3
-
B. Szyszka Transparent and conductive aluminium doped zinc oxide films prepared by mid-frequency reactive magnetron sputtering Thin Solid Films 351 1999 164 169 (Pubitemid 32213749)
-
(1999)
Thin Solid Films
, vol.351
, Issue.1-2
, pp. 164-169
-
-
Szyszka, B.1
-
19
-
-
0035477928
-
Optical and electrical properties of direct-current magnetron sputtered ZnO:Al films
-
DOI 10.1063/1.1398070
-
Z.L. Pei, C. Sun, M.H. Tan, J.Q. Xiao, and D.H. Guan Optical and electrical properties of direct-current magnetron sputtered ZnO:Al films Journal of Applied Physics 90 2001 3432 3436 (Pubitemid 33596994)
-
(2001)
Journal of Applied Physics
, vol.90
, Issue.7
, pp. 3432-3436
-
-
Pei, Z.L.1
Sun, C.2
Tan, M.H.3
Xiao, J.Q.4
Guan, D.H.5
Huang, R.F.6
Wen, L.S.7
-
21
-
-
77955514338
-
Annealing effect on surface passivation of a-Si:H/c-Si interface in terms of crystalline volume fraction
-
H.J. Yang, K.-S. Ji, J. Choi, and H.M. Lee Annealing effect on surface passivation of a-Si:H/c-Si interface in terms of crystalline volume fraction Current Applied Physics 10 2010 S375 S378
-
(2010)
Current Applied Physics
, vol.10
-
-
Yang, H.J.1
Ji, K.-S.2
Choi, J.3
Lee, H.M.4
-
22
-
-
33846632881
-
Abruptness of a-Si:H/c-Si interface revealed by carrier lifetime measurements
-
S. De Wolf, and M. Kondo Abruptness of a-Si:H/c-Si interface revealed by carrier lifetime measurements Applied Physics Letters 90 2007 042111
-
(2007)
Applied Physics Letters
, vol.90
, pp. 042111
-
-
De Wolf, S.1
Kondo, M.2
-
23
-
-
34548692775
-
Boron-doped a-Si:H/c-Si interface passivation: Degradation mechanism
-
S. De Wolf, and M. Kondo Boron-doped a-Si:H/c-Si interface passivation: degradation mechanism Applied Physics Letters 91 2007 112109
-
(2007)
Applied Physics Letters
, vol.91
, pp. 112109
-
-
De Wolf, S.1
Kondo, M.2
-
27
-
-
70349883599
-
Realistische Modellierung der NIR/VIS/UV-optischen Konstanten dünner optischer Schichten im Rahmen des Oszillatormodells
-
O. Stenzel, S. Wilbrandt, K. Friedrich, and N. Kaiser Realistische Modellierung der NIR/VIS/UV-optischen Konstanten dünner optischer Schichten im Rahmen des Oszillatormodells Vakuum in Forschung und Praxis 21 5 2009 15 23
-
(2009)
Vakuum in Forschung und Praxis
, vol.21
, Issue.5
, pp. 15-23
-
-
Stenzel, O.1
Wilbrandt, S.2
Friedrich, K.3
Kaiser, N.4
-
28
-
-
77953140100
-
Aluminium doped zinc oxide films grown by atomic layer deposition for organic photovoltaic devices
-
H. Saarenpää, T. Niemi, A. Tukiainen, H. Lemmetyinen, and N. Tkachenko Aluminium doped zinc oxide films grown by atomic layer deposition for organic photovoltaic devices Solar Energy Materials Solar Cells 94 2010 1379 1383
-
(2010)
Solar Energy Materials Solar Cells
, vol.94
, pp. 1379-1383
-
-
Saarenpää, H.1
Niemi, T.2
Tukiainen, A.3
Lemmetyinen, H.4
Tkachenko, N.5
-
29
-
-
77956420430
-
Effective atomic layer deposition procedure for Al-dopant distribution in ZnO thin films
-
J.Y. Kim, Y.-J. Choi, H.-H. Park, S. Golledge, and D.C. Johnson Effective atomic layer deposition procedure for Al-dopant distribution in ZnO thin films Journal of Vacuum Science and Technology A 28 5 2010 1111 1114
-
(2010)
Journal of Vacuum Science and Technology A
, vol.28
, Issue.5
, pp. 1111-1114
-
-
Kim, J.Y.1
Choi, Y.-J.2
Park, H.-H.3
Golledge, S.4
Johnson, D.C.5
-
31
-
-
77956336658
-
Structural, electrical and optical properties of atomic layer deposition Al-doped ZnO films
-
P. Banerjee, W.-J. Lee, K.-R. Bae, S.B. Lee, and G.W. Rubloff Structural, electrical and optical properties of atomic layer deposition Al-doped ZnO films Journal of Applied Physics 108 2010 043504
-
(2010)
Journal of Applied Physics
, vol.108
, pp. 043504
-
-
Banerjee, P.1
Lee, W.-J.2
Bae, K.-R.3
Lee, S.B.4
Rubloff, G.W.5
-
32
-
-
80054981821
-
Numerical simulation of solar cells and solar cell characterization methods: The open-source on demand program AFORS-HET
-
R.D. Rugescu, InTech Open Access Publisher ISBN:978-953-307-052-0
-
R. Stangl, J. Haschke, and C. Leendertz Numerical simulation of solar cells and solar cell characterization methods: the open-source on demand program AFORS-HET R.D. Rugescu, Solar Energy 2010 InTech Open Access Publisher 319 352 ISBN:978-953-307-052-0
-
(2010)
Solar Energy
, pp. 319-352
-
-
Stangl, R.1
Haschke, J.2
Leendertz, C.3
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