Modelling the NIR/VIS/UV optical constants of thin solid films: An oscillator model approach;Realistische Modellierung der NIR/VIS/UV-Optischen Konstanten Dünner Optischer Schichten im rahmen des oszillatormodells

Vakuum in Forschung und Praxis

Volumn 21, Issue 5, 2009, Pages 15-23

  Stenzel, Olaf ^a   Wilbrandt, Steffen ^a   Friedrich, Karen ^a   Kaiser, Norbert ^a  

^a FRAUNHOFER INSTITUTE FOR APPLIED OPTICS AND PRECISION ENGINEERING   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANGLES OF INCIDENCE; COMPUTATIONAL MANUFACTURING; DESIGN OPTIMIZATION; DIELECTRIC FUNCTIONS; DIELECTRIC OXIDES; EXTINCTION COEFFICIENTS; KRAMERS-KRONIG; METAL LAYER; OSCILLATOR MODEL; REFLECTANCE SPECTRUM; REPRODUCIBILITIES; SIDE INFORMATION; SPECTROPHOTOMETRIC MEASUREMENTS; STOCHASTIC VARIATION; THIN SOLID FILM; TRANSPARENT CONDUCTIVE OXIDES;

DESIGN; OPTICAL COATINGS; OPTIMIZATION; PROTECTIVE COATINGS; REFRACTIVE INDEX;

OPTICAL CONSTANTS;

EID: 70349883599     PISSN: 0947076X     EISSN: None     Source Type: Journal    
DOI: 10.1002/vipr.200900396     Document Type: Article

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