Identification of radiation induced dark current sources in pinned photodiode CMOS image sensors

Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS

Volumn , Issue , 2011, Pages 321-328

  Goiffon, V ^a   Virmontois, C ^a   Magnan, P ^a   Cervantes, P ^a   Gaillardin, M ^b   Girard, S ^b   Paillet, P ^b   Martin Gonthier, P ^a  

^a UNIVERSITÉ DE TOULOUSE   (France)

^b DIF   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS IMAGE SENSOR; CURRENT INCREASE; CURRENT SOURCES; DEVICE DEGRADATION; PIXEL DESIGNS; PIXEL DIMENSION; RADIATION-INDUCED; TOTAL IONIZING DOSE;

DARK CURRENTS; DEGRADATION; DIGITAL CAMERAS; IONIZING RADIATION; PHOTODIODES; RADIATION EFFECTS;

PIXELS;

EID: 84860163050     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/RADECS.2011.6131311     Document Type: Conference Paper

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